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Seokjun Jang
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2020 – today
- 2023
- [j5]Sunghoon Kim
, Seokjun Jang
, Sungho Kang
:
Scan Chain Architecture With Data Duplication for Multiple Scan Cell Fault Diagnosis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(8): 2717-2727 (2023) - [j4]Yong Lee, Seokjun Jang
, Sungho Kang
:
Shift Left Quality Management System (QMS) Using a 3-D Matrix Scanning Method on System on a Chip. IEEE Trans. Circuits Syst. II Express Briefs 70(4): 1580-1584 (2023) - [c5]Sunghoon Kim, Donghyun Han, Seokjun Jang, Sungho Kang:
LOTS: Low Overhead TSV Repair Method Using IEEE-1838 Standard Architecture. ISOCC 2023: 289-290 - 2022
- [c4]Sunghoon Kim, Seokjun Jang, Youngki Moon, Sungho Kang:
Pair-Grouping Scan Chain Architecture for Multiple Scan Cell Fault Diagnosis. ISOCC 2022: 25-26 - 2021
- [j3]Hyungil Woo
, Seokjun Jang, Sungho Kang
:
A Secure Scan Architecture Protecting Scan Test and Scan Dump Using Skew-Based Lock and Key. IEEE Access 9: 102161-102176 (2021) - [j2]Seokjun Jang, Jihye Kim
, Sungho Kang
:
Reconfigurable Scan Architecture for High Diagnostic Resolution. IEEE Access 9: 120537-120550 (2021) - [c3]Seokjun Jang, Hyungil Woo, Sunghoon Kim, Sungho Kang:
Secure Scan Design through Pseudo Fault Injection. ISOCC 2021: 425-426 - 2020
- [j1]Jihye Kim
, Hayoung Lee
, Seokjun Jang, Sungho Kang
:
Fine-Grained Defect Diagnosis for CMOL FPGA Circuits. IEEE Access 8: 163140-163151 (2020) - [c2]Jihye Kim, Hayoung Lee
, Seokjun Jang, Hogyeong Kim, Sungho Kang:
Memory-like Defect Diagnosis for CMOL FPGAs. ISOCC 2020: 139-140
2010 – 2019
- 2018
- [c1]Hyeonchan Lim, Seokjun Jang, Sungho Kang:
A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. ISOCC 2018: 265-266
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