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Bo Yao 0002

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affiliation: Intel Corp., Hillsboro, OR, USA
affiliation (PhD 2013): Purdue University, School of Electrical and Computer Engineering, USA

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2010 – 2019

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2017
[c4]
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  - conf/isvlsi/WangYLP17
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Naixing Wang, Bo Yao, Xijiang Lin, Irith Pomeranz:
Functional Broadside Test Generation Using a Commercial ATPG Tool. ISVLSI 2017: 308-313
2014
[c3]
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Bo Yao, Irith Pomeranz, Srikanth Venkataraman, M. Enamul Amyeen:
Built-in generation of functional broadside tests considering primary input constraints. ACM Great Lakes Symposium on VLSI 2014: 237-238
2013
[b1]
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  - electronic edition @ purdue.edu
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Bo Yao:
Transition faults and transition path delay faults: Test generation, path selection, and built-in generation of functional broadside tests. Purdue University, USA, 2013
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Bo Yao, Arani Sinha, Irith Pomeranz:
Path selection based on static timing analysis considering input necessary assignments. VTS 2013: 1-6
2010
[c1]
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Bo Yao, Irith Pomeranz, Sudhakar M. Reddy:
Deterministic broadside test generation for transition path delay faults. ACM Great Lakes Symposium on VLSI 2010: 135-138

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