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"Deterministic broadside test generation for transition path delay faults."

Bo Yao, Irith Pomeranz, Sudhakar M. Reddy (2010)

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DOI: 10.1145/1785481.1785514

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/glvlsi/YaoPR10
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  - https://dblp.org/rec/conf/glvlsi/YaoPR10
Bo Yao, Irith Pomeranz, Sudhakar M. Reddy:
Deterministic broadside test generation for transition path delay faults. ACM Great Lakes Symposium on VLSI 2010: 135-138

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