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2020 – today
- 2023
[j6]Nektar Xama
, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen:
Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(10): 3426-3435 (2023)- [c19]Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis. ETS 2023: 1-4 - 2022
- [j5]Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4771-4781 (2022) - 2020
- [j4]Nektar Xama, Martin Andraud, Jhon Gomez, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen:
Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations. ACM Trans. Design Autom. Electr. Syst. 25(5): 47:1-47:27 (2020) - [c18]Anthony Coyette, Wim Dobbelaere, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen:
Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing. ETS 2020: 1-6 - [c17]Nektar Xama, Jakob Raymaekers, Martin Andraud, Jhon Gomez, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Georges G. E. Gielen:
Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics. ETS 2020: 1-6 - [c16]Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen:
Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. ITC 2020: 1-10 - [c15]Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing. VTS 2020: 1-6
2010 – 2019
- 2019
- [c14]Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama, Jhon Gomez, Georges G. E. Gielen:
Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. ITC 2019: 1-4 - [c13]Wim Dobbelaere, Marco Restifo, Peter Sarson:
Innovative Practices on Automotive Test. VTS 2019: 1 - 2018
- [j3]Baris Esen, Anthony Coyette, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren:
An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes. IEEE Des. Test 35(3): 15-23 (2018) - [j2]Anthony Coyette, Baris Esen, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren:
ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits. IEEE Des. Test 35(3): 24-30 (2018) - [c12]Georges G. E. Gielen, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Nektar Xama:
Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems. ISCAS 2018: 1-4 - [c11]Wim Dobbelaere, On Semi, Massimo Violante, Turin Polytechnic, Jeff Rearick:
Innovative practices on quality levels of A/MS devices. VTS 2018: 1 - 2017
- [c10]Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen:
A very low cost and highly parallel DfT method for analog and mixed-signal circuits. ETS 2017: 1-2 - [c9]Nektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen:
Automatic testing of analog ICs for latent defects using topology modification. ETS 2017: 1-6 - [c8]Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen:
Non-intrusive detection of defects in mixed-signal integrated circuits using light activation. ITC 2017: 1-7 - 2016
- [j1]Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen:
Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization. Integr. 55: 393-400 (2016) - [c7]Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen:
Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis. ITC 2016: 1-10 - [c6]Wim Dobbelaere, Ronny Vanhooren, Willy De Man, Koen Matthijs, Anthony Coyette, Baris Esen, Georges G. E. Gielen:
Analog fault coverage improvement using final-test dynamic part average testing. ITC 2016: 1-9 - [c5]Baris Esen, Anthony Coyette, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren:
Effective DC fault models and testing approach for open defects in analog circuits. ITC 2016: 1-9 - 2015
- [c4]Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
Automatic generation of autonomous built-in observability structures for analog circuits. ETS 2015: 1-6 - [c3]Anthony Coyette, Baris Esen, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
Automated testing of mixed-signal integrated circuits by topology modification. VTS 2015: 1-6 - 2014
- [c2]Anthony Coyette, Georges G. E. Gielen, Ronny Vanhooren, Wim Dobbelaere:
Optimization of analog fault coverage by exploiting defect-specific masking. ETS 2014: 1-6 - [c1]Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren, Anthony Coyette, Baris Esen:
Design and test of analog circuits towards sub-ppm level. ITC 2014: 1-2
Coauthor Index
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