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"Applying Vstress and defect activation coverage to produce zero-defect ..."
Wim Dobbelaere et al. (2019)
- Wim Dobbelaere, Frederik Colle, Anthony Coyette, Ronny Vanhooren, Nektar Xama
, Jhon Gomez
, Georges G. E. Gielen:
Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs. ITC 2019: 1-4
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