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"Non-intrusive detection of defects in mixed-signal integrated circuits ..."

Baris Esen et al. (2017)

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DOI: 10.1109/TEST.2017.8242056

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-05

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  dblp key:
  - conf/itc/EsenCXDVG17
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Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen:
Non-intrusive detection of defects in mixed-signal integrated circuits using light activation. ITC 2017: 1-7

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