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"Non-intrusive detection of defects in mixed-signal integrated circuits ..."
Baris Esen et al. (2017)
- Baris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen:
Non-intrusive detection of defects in mixed-signal integrated circuits using light activation. ITC 2017: 1-7
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