![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
"DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using ..."
Jhon Gomez et al. (2022)
- Jhon Gomez
, Nektar Xama
, Anthony Coyette
, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4771-4781 (2022)
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.