"Impact of Negative Bias Temperature Instability on Gate-All-Around Flip-Flops."

Shiva Taghipour, Rahebeh Niaraki Asli (2019)

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DOI: 10.1007/S10836-019-05774-3

access: closed

type: Journal Article

metadata version: 2025-01-19

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Shiva Taghipour, Rahebeh Niaraki Asli:
Impact of Negative Bias Temperature Instability on Gate-All-Around Flip-Flops. J. Electron. Test. 35(1): 119-125 (2019)

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