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Mahroo Zandrahimi
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2010 – 2019
- 2019
- [j2]Mahroo Zandrahimi
, Philippe Debaud, Armand Castillejo, Zaid Al-Ars:
Evaluation of the Impact of Technology Scaling on Delay Testing for Low-Cost AVS. J. Electron. Test. 35(3): 303-315 (2019) - 2018
- [c8]Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars:
Industrial evaluation of transition fault testing for cost effective offline adaptive voltage scaling. DATE 2018: 289-292 - [c7]Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars:
An industrial case study of low cost adaptive voltage scaling using delay test patterns. DATE 2018: 999-1000 - [c6]Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars:
Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing. EWDTS 2018: 1-6 - 2017
- [c5]Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars:
Using transition fault test patterns for cost effective offline performance estimation. DTIS 2017: 1-5 - 2016
- [c4]Mahroo Zandrahimi, Zaid Al-Ars, Philippe Debaud, Armand Castillejo:
Challenges of using on-chip performance monitors for process and environmental variation compensation. DATE 2016: 1018-1019 - [c3]Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars:
Industrial approaches for performance evaluation using on-chip monitors. IDT 2016: 210-215 - 2014
- [c2]Mahroo Zandrahimi, Zaid Al-Ars:
A Survey on Low-Power Techniques for Single and Multicore Systems. ICCASA 2014: 69-74 - 2012
- [j1]Mahroo Zandrahimi, Hamid R. Zarandi, Mohammad Hadi Mottaghi:
Two effective methods to detect anomalies in embedded systems. Microelectron. J. 43(1): 77-87 (2012) - 2010
- [c1]Mahroo Zandrahimi, Alireza Zarei, Hamid R. Zarandi:
A Probabilistic Method to Detect Anomalies in Embedded Systems. DFT 2010: 152-159
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