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ORCID22. FTCS 1992: Boston, Massachusetts, USA
- Digest of Papers: FTCS-22, The Twenty-Second Annual International Symposium on Fault-Tolerant Computing, Boston, Massachusetts, USA, July 8-10, 1992. IEEE Computer Society 1992, ISBN 0-8186-2875-8
Panel: State-of-the-Practice in Fault Tolerance
Architecture
- G. Robert Redinbo:
Protecting Processing Elements in Communication Satellites. 8-17 - E. N. Elnozahy, Willy Zwaenepoel:
Replicated Distributed Process in Manetho. 18-27 - Marc Chérèque, David Powell, Philippe Reynier, Jean-Luc Richier, Jacques Voiron:
Active Replication in Delta-4. 28-37 - Lisa Spainhower, Jack Isenberg, Ram Chillarege, Joseph Berding:
Design for Fault-Tolerance in System ES/9000 Model 900. 38-47
Recovery
- Pankaj Jalote:
Dynamic Reconfiguration of CSP Programs for Fault Tolerance. 50-56 - Ramesh Karri
, Alex Orailoglu:
Scheduling with Rollback Constraints in High-Level Synthesis of Self-Recovering ASICs. 519-526 - Junsheng Long, W. Kent Fuchs, Jacob A. Abraham:
Compiler-Assisted Static Checkpoint Insertion. 58-65 - Neal J. Alewine, Shyh-Kwei Chen, Chung-Chi Jim Li, W. Kent Fuchs, Wen-mei W. Hwu:
Branch Recovery with Compiler-Assisted Multiple Instruction Retry. 66-73
Communication Protocols
- Yair Amir, Danny Dolev, Shlomo Kramer, Dalia Malki:
Transis: A Communication Subsystem for High Availability. 76-84 - Paulo Veríssimo, Luís E. T. Rodrigues:
A posteriori Agreement for Fault-Tolerant Clock Synchronization on Broadcast Networks. 527-536 - Qin Zheng, Kang G. Shin:
Fault-Tolerant Real-Time Communication in Distributed Computing Systems. 86-93
Self-Checking and Diagnosis
- Takashi Nanya, Shin'ichi Hatakenaka, Ryuichi Onoo:
Design of Fully Exercised SFS/SCD Logic Networks. 96-103 - Jien-Chung Lo, James C. Daly, Michael Nicolaidis:
Design of Static CMOS Self-Checking Circuits using Built-In Current Sensing. 104-111 - Mark G. Karpovsky, Saeed M. Chaudhry, Lev B. Levitin:
Multiple Signature Analysis: A Framework for Built-In Self-Diagnostic. 112-119
Modelling and Simulation
- Dov Bulka, Joanne Bechta Dugan:
Design and Analysis of Multibus Systems Using Projective Geometry. 122-129 - Victor F. Nicola, Philip Heidelberger, Perwez Shahabuddin:
Uniformization and Exponential Transformation: Techniques for Fast Simulation of Highly Dependable Non-Markovian Systems. 130-139 - Arif Merchant, Philip S. Yu:
Design and Modeling of Clustered RAID. 140-149 - Sandeep Juneja, Perwez Shahabuddin:
Fast Simulation of Markovian Reliability/Availability Models with General Repair Policies. 150-159
Fault-Tolerant Hypercubes and Meshes
- Jehoshua Bruck, Robert Cypher, Ching-Tien Ho:
Efficient Fault-Tolerant Mesh and Hypercube Architectures. 162-169 - Cauligi S. Raghavendra, Pei-Ji Yang, Sing-Ban Tien:
Free Dimensions - An Effective Approach to Achieving Fault Tolerance in Hypercubes. 170-177 - Shahram Latifi, Si-Qing Zheng, Nader Bagherzadeh:
Optimal Ring Embedding in Hypercubes with Faulty Links. 178-184 - M. Sultan Alam, Rami G. Melhem:
Routing in Modular Fault Tolerant Multiprocessor Systems. 185-193
Scheduling and Fault Classification
- Dar-Tzen Peng:
Performance Bounds in List Scheduling of Redundant Tasks on Multi-Processors. 196-203 - Yi-Min Wang, W. Kent Fuchs:
Scheduling Message Processing for Reducing Rollback Propagation. 204-211 - Neeraj Suri, Michelle M. Hugue, Chris J. Walter:
Reliability Modeling of Large Fault-Tolerant Systems. 212-220 - Jeffery P. Hansen, Daniel P. Siewiorek:
Models for Time Coalescence in Event Logs. 221-227
Test Pattern Generation
- Irith Pomeranz, Sudhakar M. Reddy:
A Divide-And-Conquer Approach to Test Generation for Large Synchronous Sequential Circuits. 230-237 - Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal:
Finite State Machine Testing Based on Growth and Dissappearance Faults. 238-245 - Takayuki Fujino, Hideo Fujiwara:
An Efficient Test Generation Algorithm Based on Search State Dominance. 246-253 - Silvio Bou-Ghazale, Peter N. Marinos:
Testing with Correlated Test Vectors. 254-262 - Seiji Kajihara, Haruko Shiba, Kozo Kinoshita:
Removal of Redundancy in Logic Circuits under Classification of Undetectable Faults. 263-270
Synthesis for Testability and Fault Protection
- Ashutosh Mujumdar, Kewal K. Saluja, Rajiv Jain:
Incorporating Testability Considerations in High-Level Systhesis. 272-279 - Niraj K. Jha, Irith Pomeranz, Sudhakar M. Reddy, Robert J. Miller:
Synthesis of Multi-Level Combinational Circuits for Complete Robust Path Delay Fault Testability. 280-287 - Alexandre Yakovlev:
A Structural Technique For Fault-Protection in Asynchronous Interfaces. 288-295
Control Flow Checking
- Bernhard Eschermann:
On Combining Off-Line BIST and On-Line Control Flow Checking. 298-305 - Scott H. Robinson, John Paul Shen:
Direct Methods for Synthesis of Self-Monitoring State Machines. 306-315 - Joakim Ohlsson, Marcus Rimén, Ulf Gunneflo:
A Study of the Effects of Transient Fault Injection into a 32-bit RISC with Built-in Watchdog. 316-325
Fault Injection
- Seyed Ghassem Miremadi, Johan Karlsson, Ulf Gunneflo, Jan Torin:
Two Software Techniques for On-line Error Detection. 328-335 - Ghani A. Kanawati, Nasser A. Kanawati, Jacob A. Abraham:
FERRARI: A Tool for The Validation of System Dependability Properties. 336-344 - Dimiter R. Avresky, Jean Arlat, Jean-Claude Laprie, Yves Crouzet:
Fault Injection for the Formal Testing of Fault Tolerance. 345-354
Wafer Testing and Defect Tolerance
- Charles H. Stapper:
A New Statistical Approach for Fault-Tolerant VLSI Systems. 356-365 - Adit D. Singh, C. Mani Krishna:
Chip Test Optimization Using Defect Clustering Information. 366-373 - Kaiyuan Huang, Vinod K. Agarwal, Laurence E. LaForge:
Wafer Testing with Pairwise Comparisons. 374-383
Fault Tolerance Theory
- David Powell:
Failure Mode Assumptions and Assumption Coverage. 386-395 - Anish Arora, Mohamed G. Gouda:
Closure and Convergence: A Formulation of Fault-Tolerant Computing. 396-403 - Behrooz Parhami:
Optimal Algorithms for Exact, Inexact, and Approval Voting. 404-411 - Yoichi Koyanagi, Yoshihiro Tohma:
Fault Tolerant Neural Networks in Optimization Problems. 412-418
System Fault Detection and Reconfiguration
- Jamlung Sung, G. Robert Redinbo:
Protecting Practical FFT Implementations that Share Common Processing Elements. 420-429 - Fikri T. Assaad, Shantanu Dutt:
More Robust Tests in Algorithm-Based Fault-Tolerant Matrix Multiplication. 430-439 - Srinivasan Tridandapani, Arun K. Somani:
Efficient Utilization of Spare Capacity for Fault Detection and Location in Multiprocessor Systems. 440-447 - Michael Peercy, Prithviraj Banerjee:
Design and Analysis of Software Reconfiguration Strategies for Hypercube Multicomputers under Multiple Faults. 448-455
Field Experience
- Andrew L. Reibman:
Outage Times in Fault-Tolerant Systems. 458-462 - Ann C. Merenda, Ed Merenda:
Recovery/Serviceability System Test Improvements for the IBM ES/9000 520 Based Models. 463-467 - Robert P. Colwell:
Latent Design Faults in the Development of Multiflow's TRACE/200. 468-474 - Mark Sullivan, Ram Chillarege:
A Comparison of Software Defects in Database Management Systems and Operating Systems. 475-484
Error-Correcting Codes
- Mario Blaum, Jehoshua Bruck:
Unordered Error-Correcting Codes and their Applications. 468-493 - Eiji Fujiwara, Mitsuru Hamada:
Single b-Bit Byte Error Correcting and Double Bit Error Detecting Codes for High-Speed Memory Systems. 494-501 - T. R. N. Rao, Gui Liang Feng, Mahadev S. Kolluru:
Efficient Multiple Unidirectional Byte Error-Detecting Codes for Computer Memory Systems. 502-509 - Sulaiman Al-Bassam, Gowri Ramanathan, Bella Bose:
Improved Construction Methods for Error Correcting Constant Weight Codes. 510-517
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