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"Wafer Testing with Pairwise Comparisons."
Kaiyuan Huang, Vinod K. Agarwal, Laurence E. LaForge (1992)
- Kaiyuan Huang, Vinod K. Agarwal, Laurence E. LaForge:
Wafer Testing with Pairwise Comparisons. FTCS 1992: 374-383
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