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Dongwoo Lee , Jongwhoa Na : A Novel Simulation Fault Injection Method for Dependability Analysis. IEEE Des. Test Comput. 26 (6 ) : 50-61 (2009 )share record
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Timothée Levi , Jean Tomas , Noëlle Lewis , Pascal Fouillat : A CMOS Resizing Methodology for Analog Circuits. IEEE Des. Test Comput. 26 (1 ) : 78-87 (2009 )share record
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Yanjing Li , Young Moon Kim , Evelyn Mintarno , Donald S. Gardner , Subhasish Mitra : Overcoming Early-Life Failure and Aging for Robust Systems. IEEE Des. Test Comput. 26 (6 ) : 28-39 (2009 )export record
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Erik Jan Marinissen , Yervant Zorian : Guest Editors' Introduction: The Status of IEEE Std 1500. IEEE Des. Test Comput. 26 (1 ) : 6-7 (2009 )export record
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Erik Jan Marinissen , Yervant Zorian : IEEE Std 1500 Enables Modular SoC Testing. IEEE Des. Test Comput. 26 (1 ) : 8-17 (2009 )export record
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Erik Jan Marinissen , Yervant Zorian : Guest Editors' Introduction: The Status of IEEE Std 1500 - Part 2. IEEE Des. Test Comput. 26 (3 ) : 4 (2009 )share record
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Igor L. Markov : Book Review: A physical-design picture book. IEEE Des. Test Comput. 26 (4 ) : 100-101 (2009 )share record
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Grant Martin : Processor Stew (review of Processor Description Languages by P. Mishra and N. Dutt, Eds.; 2008) [Book reviews]. IEEE Des. Test Comput. 26 (2 ) : 76-77 (2009 )share record
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Grant Martin : Teaching someone to fish. IEEE Des. Test Comput. 26 (5 ) : 106-107 (2009 )share record
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Grant Martin , Gary Smith : High-Level Synthesis: Past, Present, and Future. IEEE Des. Test Comput. 26 (4 ) : 18-25 (2009 )share record
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Anmol Mathur , Masahiro Fujita , Edmund M. Clarke , Pascal Urard : Functional Equivalence Verification Tools in High-Level Synthesis Flows. IEEE Des. Test Comput. 26 (4 ) : 88-95 (2009 )export record
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Iakovos Mavroidis , Ioannis Mavroidis , Ioannis Papaefstathiou : Accelerating Emulation and Providing Full Chip Observability and Controllability. IEEE Des. Test Comput. 26 (6 ) : 84-94 (2009 )share record
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Teresa L. McLaurin , Stylianos Diamantidis , Irakis Diamantidis : The ARM Cortex-A8 Microprocessor IEEE Std 1500 Wrapper. IEEE Des. Test Comput. 26 (1 ) : 44-51 (2009 )share record
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María C. Molina , Rafael Ruiz-Sautua , Alberto A. Del Barrio , Jose Manuel Mendias : Subword Switching Activity Minimization to Optimize Dynamic Power Consumption. IEEE Des. Test Comput. 26 (4 ) : 68-77 (2009 )export record
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Benoit Nadeau-Dostie , Saman Adham , Russell Abbott : Improved Core Isolation and Access for Hierarchical Embedded Test. IEEE Des. Test Comput. 26 (1 ) : 18-25 (2009 )share record
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Sang Phill Park , Kunhyuk Kang , Kaushik Roy : Reliability Implications of Bias-Temperature Instability in Digital ICs. IEEE Des. Test Comput. 26 (6 ) : 8-17 (2009 )share record
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Ishwar Parulkar , Babu Turumella : Comprehensive Approach to High-Performance Server Chipset Debug. IEEE Des. Test Comput. 26 (3 ) : 70-77 (2009 )export record
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Roberto Passerone , Imene Ben Hafaiedh , Susanne Graf , Albert Benveniste , Daniela Cancila , Arnaud Cuccuru , Sebastien Gerard , François Terrier , Werner Damm , Alberto Ferrari , Leonardo Mangeruca , Bernhard Josko , Thomas Peikenkamp , Alberto L. Sangiovanni-Vincentelli : Metamodels in Europe: Languages, Tools, and Applications. IEEE Des. Test Comput. 26 (3 ) : 38-53 (2009 )share record
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Wenjing Rao , Alex Orailoglu , Ramesh Karri : Logic Mapping in Crossbar-Based Nanoarchitectures. IEEE Des. Test Comput. 26 (1 ) : 68-77 (2009 )share record
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Jude A. Rivers , Prabhakar Kudva : Reliability Challenges and System Performance at the Architecture Level. IEEE Des. Test Comput. 26 (6 ) : 62-73 (2009 )share record
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Gordon W. Roberts , Sadok Aouini : Mixed-Signal Production Test: A Measurement Principle Perspective. IEEE Des. Test Comput. 26 (5 ) : 48-62 (2009 )share record
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Martin Ruckert , Axel Böttcher , Martin Hauser : A Generic Virtual Bus for Hardware Simulator Composition. IEEE Des. Test Comput. 26 (5 ) : 83-91 (2009 )export record
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Alberto L. Sangiovanni-Vincentelli , Sandeep K. Shukla , Janos Sztipanovits , Guang Yang , Deepak Mathaikutty : Metamodeling: An Emerging Representation Paradigm for System-Level Design. IEEE Des. Test Comput. 26 (3 ) : 54-69 (2009 )share record
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Soujanna Sarkar , Shashank Dabral , Praveen Tiwari , Raj S. Mitra : Lessons and Experiences with High-Level Synthesis. IEEE Des. Test Comput. 26 (4 ) : 34-45 (2009 )export record
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Jean-Pierre Schoellkopf , Philippe Magarshack : Low-Power Design Solutions forWireless Multimedia SoCs. IEEE Des. Test Comput. 26 (2 ) : 20-29 (2009 )share record
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Sandeep K. Shukla : Metamodeling: What is it good for? IEEE Des. Test Comput. 26 (3 ) : 96 (2009 )export record
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Ozgur Sinanoglu , Erik Jan Marinissen , Anuja Sehgal , Jeff Fitzgerald , Jeff Rearick : Test Data Volume Comparison: Monolithic vs. Modular SoC Testing. IEEE Des. Test Comput. 26 (3 ) : 25-37 (2009 )share record
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Gadi Singer , Rajesh Galivanche , Srinivas Patil , Mike Tripp : The Challenges of Nanotechnology and Gigacomplexity. IEEE Des. Test Comput. 26 (1 ) : 88-93 (2009 )share record
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Prashant Singh , Cheng Zhuo , Eric Karl , David T. Blaauw , Dennis Sylvester : Sensor-Driven Reliability and Wearout Management. IEEE Des. Test Comput. 26 (6 ) : 40-49 (2009 )share record
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Hongbin Sun , Jibang Liu , Rakesh S. Anigundi , Nanning Zheng , Jian-Qiang Lu , Kenneth Rose , Tong Zhang : 3D DRAM Design and Application to 3D Multicore Systems. IEEE Des. Test Comput. 26 (5 ) : 36-47 (2009 )