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ORCID"IEEE Std 1500 Enables Modular SoC Testing."
Erik Jan Marinissen, Yervant Zorian (2009)
- Erik Jan Marinissen, Yervant Zorian:
IEEE Std 1500 Enables Modular SoC Testing. IEEE Des. Test Comput. 26(1): 8-17 (2009)
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