- 2004
- Kenneth P. Parker:
A New Probing Technique for High-Speed/High-Density Printed Circuit Boards. ITC 2004: 365-374 - Kenneth P. Parker:
Board Test Coverage Needs to be Standardized. ITC 2004: 1426 - 2003
- Gareth J. Parker, Ken Lever:
An approach to reducing the effect of contamination on the desired response of a frequency domain adaptive filter. Digit. Signal Process. 13(4): 569-587 (2003) - Bill Eklow, Carl Barnhart, Kenneth P. Parker:
IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks. IEEE Des. Test Comput. 20(5): 76-83 (2003) - Kenneth P. Parker:
Testing for what? IEEE Des. Test Comput. 20(2): 96- (2003) - Michael J. Agostini, Gordon G. Parker, Hanspeter Schaub, Kenneth N. Groom, Rush D. Robinett:
Generating swing-suppressed maneuvers for crane systems with rate saturation. IEEE Trans. Control. Syst. Technol. 11(4): 471-481 (2003) - Alok B. Asoor, Kenneth R. Muske, William J. Kelly, Robert S. Parker:
Dynamic cellular modeling for continuous fermentation. ACC 2003: 2389-2394 - Kenneth P. Parker:
Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes? ITC 2003: 1268-1276 - 2002
- Henry Been-Lirn Duh, James Jeng-Weei Lin, Robert V. Kenyon, Donald E. Parker, Thomas A. Furness:
Effects of Characteristics of Image Quality in an Immersive Environment. Presence Teleoperators Virtual Environ. 11(3): 324-332 (2002) - Michael J. Agostini, Gordon G. Parker, Kenneth N. Groom, Hanspeter Schaub, Rush D. Robinett:
Command shaping and closed-loop control interactions for a ship crane. ACC 2002: 2298-2304 - Bill Eklow, Carl Barnhart, Kenneth P. Parker:
IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. ITC 2002: 1056-1065 - Kathy Hird, Kenneth P. Parker, Bill Follis:
Test Coverage: What Does It Mean When a Board Test Passes?. ITC 2002: 1066-1074 - Kenneth P. Parker:
Board Test Is NOT Mature. ITC 2002: 1238 - 2001
- Michael J. Agostini, Gordon G. Parker, Erin E. Kruse, Hanspeter Schaub, Kenneth N. Groom, Rush D. Robinett:
Multiple axis boom crane maneuver generation for payload swing suppression. ACC 2001: 287-292 - Ken Parker, Xie Hongyan:
Towards appropriate design tools for inclusive kitchens. HCI 2001: 612-616 - Young Kim, Benny Lai, Kenneth P. Parker, Jeff Rearick:
Frequency detection-based boundary-scan testing of AC coupled nets. ITC 2001: 46-53 - Henry Been-Lirn Duh, James Jeng-Weei Lin, Robert V. Kenyon, Donald E. Parker, Thomas A. Furness:
Effects of Field of View on Balance in an Immersive Environment. VR 2001: 235-240 - 2000
- Kenneth P. Parker:
System issues in boundary-scan board test. ITC 2000: 724-728 - 1999
- Frank Stenger, Sven-Åke Gustafson, Brian Keyes, Michael O'Reilly, Ken Parker:
ODE-IVP-PACK via Sinc indefinite integration and Newton's method. Numer. Algorithms 20(2-3): 241-268 (1999) - Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala:
Expediting ramp-to-volume production. ITC 1999: 103-112 - Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith:
Correlation of logical failures to a suspect process step. ITC 1999: 458-476 - 1997
- Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa:
Design, Fabrications and Use of Mixed-Signal IC Testability Structures. ITC 1997: 489-498 - 1996
- Kenneth P. Parker:
Introduction ITC 1996 Lecture Series on Unpowered Opens Testing. ITC 1996: 924 - Mick Tegethoff, Kenneth P. Parker, Ken Lee:
Opens Board Test Coverage: When is 99% Really 40%? ITC 1996: 333-339 - 1995
- Mick Tegethoff, Kenneth P. Parker:
IEEE Std 1149.1: Where Are We? Where From Here? IEEE Des. Test Comput. 12(2): 53-59 (1995) - Kenneth P. Parker, David Greene:
The ITC Lecture Series: An Experiment. ITC 1995: 925 - Joseph L. Zachary, Christopher R. Johnson, Eric Eide, Kenneth W. Parker:
An entry-level course in computational engineering and science. SIGCSE 1995: 209-213 - 1994
- Kenneth P. Parker:
Observations on the 1149.x Family of Standards. ITC 1994: 1023 - 1993
- Kenneth P. Parker, John E. McDermid, Stig Oresjo:
Structure and Metrology for an Analog Testability Bus. ITC 1993: 309-322 - Robert C. Zeleznik, Kenneth P. Herndon, Daniel C. Robbins, Nate Huang, Tom Meyer, Noah Parker, John F. Hughes:
An interactive 3D toolkit for constructing 3D widgets. SIGGRAPH 1993: 81-84