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Nadine Buard
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2000 – 2009
- 2009
- [c7]Antonin Bougerol, Florent Miller, Nadine Buard:
Novel DRAM mitigation technique. IOLTS 2009: 109-113 - 2008
- [c6]Antonin Bougerol, Florent Miller, Nadine Buard:
SDRAM Architecture & Single Event Effects Revealed with Laser. IOLTS 2008: 283-288 - 2007
- [c5]Nadine Buard, Florent Miller, Cédric Ruby, Rémi Gaillard:
Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks? IOLTS 2007: 63-70 - [c4]Claudia Rusu, Antonin Bougerol, Lorena Anghel
, Cécile Weulersse, Nadine Buard, S. Benhammadi, Nicolas Renaud, Guillaume Hubert
, Frederic Wrobel
, Thierry Carrière, Rémi Gaillard:
Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells. IOLTS 2007: 137-145 - 2006
- [c3]Guillaume Hubert
, Antonin Bougerol, Florent Miller, Nadine Buard, Lorena Anghel
, Thierry Carrière, Frederic Wrobel
, Rémi Gaillard:
Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells. IOLTS 2006: 63-74 - [c2]Lorena Anghel, Michael Nicolaidis, Nadine Buard:
From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately? IOLTS 2006: 85 - 2005
- [c1]Guillaume Hubert
, Nadine Buard, Cécile Weulersse, Thierry Carrière, Marie-Catherine Palau, Jean-Marie Palau, Damien Lambert
, Jacques Baggio, Frederic Wrobel, Frédéric Saigné, Rémi Gaillard:
A Review of DASIE Code Family: Contribution to SEU/MBU Understanding. IOLTS 2005: 87-94 - 2003
- [j1]Frédéric Darracq, Hervé Lapuyade, Nadine Buard, Pascal Fouillat, R. Dufayel, Thierry Carrière:
Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. Microelectron. Reliab. 43(9-11): 1615-1619 (2003)
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