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ORCIDW. S. Lau
This is just a disambiguation page, and is not intended to be the bibliography of an actual person. Any publication listed on this page has not been assigned to an actual author yet. If you know the true author of one of the publications listed below, you are welcome to contact us.
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2010 – 2019
- 2016
[j17]Xuan Feng, Shurong Dong, Hei Wong
, Danqun Yu, Kin Leong Pey, Kalya Shubhakar, W. S. Lau:
Effects of thermal annealing on the charge localization characteristics of HfO2/Au/HfO2 stack. Microelectron. Reliab. 61: 78-81 (2016)- [j16]Danqun Yu, W. S. Lau, Hei Wong, Xuan Feng, Shurong Dong, Kin Leong Pey:
The variation of the leakage current characteristics of W/Ta2O5/W MIM capacitors with the thickness of the bottom W electrode. Microelectron. Reliab. 61: 95-98 (2016) - 2014
- [j15]Hailian Liang, Weidong Nie, Xiaofeng Gu, Shurong Dong, W. S. Lau:
An investigation on capacitance-trigger ESD protection devices for high voltage integrated circuits. Microelectron. Reliab. 54(6-7): 1169-1172 (2014) - 2012
- [j14]W. S. Lau, Peizhen Yang, S. Y. Siah, L. Chan:
The role of a tensile stress bias for a sensitive silicon mechanical stress sensor based on a change in gate-induced-drain leakage current. Microelectron. Reliab. 52(11): 2847-2850 (2012) - 2010
- [j13]W. S. Lau, Peizhen Yang, Eng Hua Lim, Yee Ling Tang, Seow Wei Lai, V. L. Lo, S. Y. Siah, L. Chan:
Observation of halo implant from the drain side reaching the source side and vice versa in extremely short p-channel transistors. Microelectron. Reliab. 50(3): 346-350 (2010)
2000 – 2009
- 2009
- [j12]W. S. Lau, Peizhen Yang, Jason Zhiwei Chian, V. Ho, C. H. Loh, S. Y. Siah, L. Chan:
Drain current saturation at high drain voltage due to pinch off instead of velocity saturation in sub-100 nm metal-oxide-semiconductor transistors. Microelectron. Reliab. 49(1): 1-7 (2009) - [j11]W. S. Lau, Joy B. H. Tan, B. P. Singh:
Formation of Ohmic contacts in AlGaN/GaN HEMT structures at 500 degreeC by Ohmic contact recess etching. Microelectron. Reliab. 49(5): 558-561 (2009) - 2008
- [j10]W. S. Lau, Peizhen Yang, C. W. Eng, V. Ho, C. H. Loh, S. Y. Siah, D. Vigar, L. Chan:
A study of the linearity between Ion and log Ioff of modern MOS transistors and its application to stress engineering. Microelectron. Reliab. 48(4): 497-503 (2008) - [j9]W. S. Lau, W. T. Wong, Joy B. H. Tan, B. P. Singh:
Effect of a trace of water vapor on Ohmic contact formation for AlGaN/GaN epitaxial wafers. Microelectron. Reliab. 48(5): 794-797 (2008) - [j8]W. S. Lau, K. S. See, C. W. Eng, W. K. Aw, Kang-Hyun Jo, K. C. Tee, James Y. M. Lee, Elgin K. B. Quek, H. S. Kim, Simon T. H. Chan, L. Chan:
Anomalous narrow width effect in p-channel metal-oxide-semiconductor surface channel transistors using shallow trench isolation technology. Microelectron. Reliab. 48(6): 919-922 (2008) - [j7]W. S. Lau, Peizhen Yang, V. Ho, L. F. Toh, Y. Liu, S. Y. Siah, L. Chan:
An explanation of the dependence of the effective saturation velocity on gate voltage in sub-0.1 µm metal-oxide-semiconductor transistors by quasi-ballistic transport theory. Microelectron. Reliab. 48(10): 1641-1648 (2008) - [j6]Huang Zhong, W. S. Lau, W. F. Sze, Y. S. Hung:
Shape recovery from turntable sequence using rim reconstruction. Pattern Recognit. 41(11): 3295-3301 (2008) - 2007
- [j5]W. S. Lau, P. W. Qian, Taejoon Han, Nathan P. Sandler, S. T. Che, S. E. Ang, C. H. Tung, T. T. Sheng:
Evidence that N2O is a stronger oxidizing agent than O2 for both Ta2O5 and bare Si below 1000degreeC and temperature for minimum low-K interfacial oxide for high-K dielectric on Si. Microelectron. Reliab. 47(2-3): 429-433 (2007) - [c1]Huang Zhong, W. S. Lau, W. F. Sze, Y. S. Hung:
Shape Recovery from Turntable Image Sequence. ACCV (2) 2007: 186-195 - 2001
- [j4]Simon S. P. Shum, W. S. Lau, Matthew M. F. Yuen, Kai-Ming Yu:
Solid reconstruction from orthographic views using 2-stage extrusion. Comput. Aided Des. 33(1): 91-102 (2001) - 2000
- [j3]R. V. V. V. J. Rao, T. C. Chong, L. S. Tan, W. S. Lau:
Thermal stability of MISFET with low-temp molecular-beam epitaxy-grown GaAs and Al0.3Ga0.7As gate ins. IEEE Trans. Reliab. 49(2): 147-152 (2000)
1990 – 1999
- 1998
- [j2]S. F. Lee, P. Roberts, W. S. Lau, S. K. Bhattacharyya:
Sun Tzu's as business and management strategies for world class business excellence evaluation under QFD methodology. Bus. Process. Manag. J. 4(2): 96-113 (1998) - 1997
- [j1]Simon S. P. Shum, W. S. Lau, Matthew Ming-Fai Yuen, Kai-Ming Yu:
Solid reconstruction from orthographic opaque views using incremental extrusion. Comput. Graph. 21(6): 787-800 (1997)
Coauthor Index
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