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ORCIDJianfu Zhang 0001
Person information
- affiliation: Liverpool John Moores University, Department of Electronics and Electrical Engineering, UK
Other persons with the same name
- Jianfu Zhang 0002
![[0000-0002-7672-7682]](https://dblp.uni-trier.de/img/orcid-mark.12x12.png "0000-0002-7672-7682")
— Tsinghua University, Department of Mechanical Engineering, Beijing, China (and 1 more) - Jianfu Zhang 0003 — Shanghai Jiao Tong University, Department of Computer Science and Engineering, China
- Jianfu Zhang 0005 — Oregon State University, Corvallis, OR, USA
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2020 – today
- 2023
[j10]James Brown, Kean Hong Tok, Rui Gao, Zhigang Ji, Weidong Zhang, John S. Marsland, Thomas Chiarella, Jacopo Franco, Ben Kaczer, Dimitri Linten, Jianfu Zhang:
A Pragmatic Model to Predict Future Device Aging. IEEE Access 11: 127725-127736 (2023)- [j9]Xiang Liu, Pengpeng Ren, Hai-Bao Chen, Zhigang Ji, Junhua Liu, Runsheng Wang, Jianfu Zhang, Ru Huang:
Equiprobability-Based Local Response Surface Method for High-Sigma Yield Estimation With Both High Accuracy and Efficiency. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(4): 1346-1350 (2023) - [c11]Zheng Chai, Weidong Zhang, Jian Fu Zhang:
Stochastic Computing Based on Volatile Ovonic Threshold Switching Devices. ASICON 2023: 1-4 - [c10]Kean Hong Tok, Jian Fu Zhang, James Brown, Zhigang Ji, Weidong Zhang:
Extracting statistical distributions of RTN originating from both acceptor-like and donor-like traps. ASICON 2023: 1-4 - 2022
- [j8]Yan Du, Wei Shao, Zheng Chai, Hanzhang Zhao, Qihui Diao, Yawei Gao, Xihui Yuan, Qiaoqiao Wang, Tao Li, Weidong Zhang, Jian Fu Zhang, Tai Min:
Synaptic 1/f noise injection for overfitting suppression in hardware neural networks. Neuromorph. Comput. Eng. 2(3): 34006 (2022) - 2021
- [j7]Mehzabeen Mehedi, Kean Hong Tok, Zengliang Ye, Jianfu Zhang, Zhigang Ji, Weidong Zhang, John S. Marsland:
On the Accuracy in Modeling the Statistical Distribution of Random Telegraph Noise Amplitude. IEEE Access 9: 43551-43561 (2021) - [j6]Chunyang Liu, Pengpeng Ren, Bo Zhou, Jianfu Zhang, Hui Fang, Zhigang Ji:
Investigation on the Implementation of Stateful Minority Logic for Future In-Memory Computing. IEEE Access 9: 168648-168655 (2021) - [c9]Zheng Chai, Pedro Freitas, Weidong Zhang, Jian Fu Zhang, John S. Marsland:
True random number generator based on switching probability of volatile GeXSe1-X ovonic threshold switching selectors. ASICON 2021: 1-4 - [c8]Mehzabeen Mehedi, Kean Hong Tok, Jian Fu Zhang, Zhigang Ji, Zengliang Ye, Weidong Zhang, John S. Marsland:
An integrated method for extracting the statistical distribution of RTN time constants. ASICON 2021: 1-4 - [c7]Zhigang Ji, Jianfu Zhang:
Understanding Generated RTN as an Entropy Source for True Random Number Generators. ICICDT 2021: 1-4 - 2020
- [j5]Mehzabeen Mehedi, Kean Hong Tok, Jianfu Zhang, Zhigang Ji, Zengliang Ye, Weidong Zhang, John S. Marsland:
An Assessment of the Statistical Distribution of Random Telegraph Noise Time Constants. IEEE Access 8: 182273-182282 (2020) - [c6]Rui Gao, Mehzabeen Mehedi, Haibao Chen, Xinsheng Wang, Jianfu Zhang, Xiaoling Lin, Zhiyuan He, Yiqiang Chen, Dengyun Lei, Yun Huang, Yunfei En, Zhigang Ji, Runsheng Wang:
A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs. IRPS 2020: 1-5
2010 – 2019
- 2019
- [c5]Jianfu Zhang, Azrif Manut, Rui Gao, Mehzabeen Mehedi, Zhigang Ji, Weidong Zhang, John S. Marsland:
An assessment of RTN-induced threshold voltage jitter. ASICON 2019: 1-4 - [c4]Jian Fu Zhang, Zhigang Ji, Meng Duan, Wei Dong Zhang, Cezhou Zhao:
Voltage step stress: a technique for reducing test time of device ageing. ICICDT 2019: 1-4 - 2018
- [j4]Jianfu Zhang, Zhigang Ji, Wei Dong Zhang:
As-grown-generation (AG) model of NBTI: A shift from fitting test data to prediction. Microelectron. Reliab. 80: 109-123 (2018) - 2017
- [c3]Jianfu Zhang, Meng Duan, Zhigang Ji, Weidong Zhang:
Hot carrier aging of nano-scale devices: Characterization method, statistical variation, and their impact on use voltage. ASICON 2017: 670-673 - 2015
- [c2]Jianfu Zhang, Meng Duan, Zhigang Ji, Weidong Zhang:
NBTI prediction and its induced time dependent variation. ASICON 2015: 1-4 - [c1]Zhigang Ji, Dimitri Linten, Roman Boschke, Geert Hellings, S. H. Chen, AliReza Alian, D. Zhou, Yves Mols, Tsvetan Ivanov, Jacopo Franco, Ben Kaczer, X. Zhang, R. Gao, Jianfu Zhang, Weidong Zhang, Nadine Collaert, Guido Groeseneken:
ESD characterization of planar InGaAs devices. IRPS 2015: 3 - 2014
- [j3]Baojun Tang, Weidong Zhang, Laurent Breuil, Colin Robinson, Yunqi Wang, Maria Toledano-Luque, Geert Van den Bosch, Jianfu Zhang, Jan Van Houdt:
Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations. Microelectron. Reliab. 54(9-10): 2258-2261 (2014) - [j2]Sharifah Wan Muhamad Hatta, Zhigang Ji, Jianfu Zhang, Weidong Zhang, Norhayati Soin, Ben Kaczer, Stefan De Gendt, Guido Groeseneken:
Energy distribution of positive charges in high-k dielectric. Microelectron. Reliab. 54(9-10): 2329-2333 (2014) - 2010
- [j1]Sharifah Wan Muhamad Hatta, Norhayati Soin, D. Abd Hadi, Jianfu Zhang:
NBTI degradation effect on advanced-process 45 nm high-k PMOSFETs with geometric and process variations. Microelectron. Reliab. 50(9-11): 1283-1289 (2010)
Coauthor Index
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