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Maurice Lousberg
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2000 – 2009
- 2007
- [c15]Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi:
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. VTS 2007: 145-150 - [c14]Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi:
Diagnosis of Full Open Defects in Interconnecting Lines. VTS 2007: 158-166 - [i1]Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen:
Memory Testing Under Different Stress Conditions: An Industrial Evaluation. CoRR abs/0710.4693 (2007) - 2005
- [c13]Tom Waayers, Erik Jan Marinissen, Maurice Lousberg:
IEEE Std 1500 Compliant Infrastructure forModular SOC Testing. Asian Test Symposium 2005: 450 - [c12]Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen:
Memory Testing Under Different Stress Conditions: An Industrial Evaluation. DATE 2005: 438-443 - [c11]Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen:
Memory testing improvements through different stress conditions. ESSCIRC 2005: 299-302 - [c10]Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, Maurice Lousberg:
A New Algorithm for Dynamic Faults Detection in RAMs. VTS 2005: 177-182 - 2003
- [j2]Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg:
On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up. J. Electron. Test. 19(4): 369-376 (2003) - [c9]Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger:
Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. VTS 2003: 345-350 - 2002
- [j1]Erik Jan Marinissen, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti, Yervant Zorian:
On IEEE P1500's Standard for Embedded Core Test. J. Electron. Test. 18(4-5): 365-383 (2002) - [c8]Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg:
An Effective Diagnosis Method to Support Yield Improvement. ITC 2002: 260-269 - 2001
- [c7]Rohit Kapur, Maurice Lousberg, Tony Taylor, Brion L. Keller, Paul Reuter, Douglas Kay:
CTL the language for describing core-based test. ITC 2001: 131-139 - [c6]Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti:
IP and Automation to Support IEEE P1500. VTS 2001: 411-412 - 2000
- [c5]Will R. Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg:
Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? ITC 2000: 95-104 - [c4]Yervant Zorian, Erik Jan Marinissen, Maurice Lousberg, Sandeep Kumar Goel:
Wrapper design for embedded core test. ITC 2000: 911-920
1990 – 1999
- 1999
- [c3]Erik Jan Marinissen, Maurice Lousberg:
The role of test protocols in testing embedded-core-based system ICs. ETW 1999: 70-75 - [c2]Alex S. Biewenga, Henk D. L. Hollmann, Frans G. M. de Jong, Maurice Lousberg:
Static component interconnect test technology (SCITT) a new technology for assembly testing. ITC 1999: 439-448 - 1998
- [c1]Erik Jan Marinissen, Robert G. J. Arendsen, Gerard Bos, Hans Dingemanse, Maurice Lousberg, Clemens Wouters:
A structured and scalable mechanism for test access to embedded reusable cores. ITC 1998: 284-293
Coauthor Index
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