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"On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up."

Camelia Hora et al. (2003)

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DOI: 10.1023/A:1024636424035

access: closed

type: Journal Article

metadata version: 2020-09-11

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  dblp key:
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  - https://dblp.org/rec/journals/et/HoraSEL03
Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg:
On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up. J. Electron. Test. 19(4): 369-376 (2003)

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