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Roberto Menozzi
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Journal Articles
- 2018
- [j37]Peter Ersland, Roberto Menozzi:
Editorial. Microelectron. Reliab. 83: 206 (2018) - 2017
- [j36]Peter Ersland, Roberto Menozzi:
Editorial. Microelectron. Reliab. 68: 1 (2017) - 2015
- [j35]Peter Ersland, Roberto Menozzi:
Editorial. Microelectron. Reliab. 55(12): 2483 (2015) - 2014
- [j34]Peter Ersland, Roberto Menozzi:
Editorial. Microelectron. Reliab. 54(2): 341 (2014) - [j33]Peter Ersland, Roberto Menozzi:
Editorial. Microelectron. Reliab. 54(12): 2649 (2014) - 2013
- [j32]Francesco Giuliani, Nicola Delmonte, Paolo Cova, Roberto Menozzi:
Temperature-dependent reverse-bias stress of normally-off GaN power FETs. Microelectron. Reliab. 53(9-11): 1486-1490 (2013) - 2012
- [j31]Peter Ersland, Roberto Menozzi:
Editorial. Microelectron. Reliab. 52(1): 1 (2012) - [j30]Peter Ersland, Roberto Menozzi:
Editorial. Microelectron. Reliab. 52(12): 2863 (2012) - 2011
- [j29]Peter Ersland, Roberto Menozzi:
Editorial. Microelectron. Reliab. 51(2): 187 (2011) - [j28]D. Mari, Mirko Bernardoni, Giovanna Sozzi, Roberto Menozzi, Gilberto Antonio Umana-Membreno, Brett D. Nener:
A physical large-signal model for GaN HEMTS including self-heating and trap-related dispersion. Microelectron. Reliab. 51(2): 229-234 (2011) - [j27]Antonio Raffo, Sergio Di Falco, Giovanna Sozzi, Roberto Menozzi, Dominique M. M.-P. Schreurs, Giorgio Vannini:
Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime. Microelectron. Reliab. 51(2): 235-239 (2011) - [j26]Paolo Cova, Mirko Bernardoni, Nicola Delmonte, Roberto Menozzi:
Dynamic electro-thermal modeling for power device assemblies. Microelectron. Reliab. 51(9-11): 1948-1953 (2011) - 2010
- [j25]Peter Ersland, Roberto Menozzi:
Editorial. Microelectron. Reliab. 50(6): 757 (2010) - [j24]Mirko Bernardoni, Nicola Delmonte, Paolo Cova, Roberto Menozzi:
Thermal modeling of planar transformer for switching power converters. Microelectron. Reliab. 50(9-11): 1778-1782 (2010) - 2009
- [j23]Peter Ersland, Roberto Menozzi:
Editorial. Microelectron. Reliab. 49(5): 467 (2009) - [j22]Fulvio Bertoluzza, Nicola Delmonte, Roberto Menozzi:
Three-dimensional finite-element thermal simulation of GaN-based HEMTs. Microelectron. Reliab. 49(5): 468-473 (2009) - [j21]Mirko Bernardoni, Paolo Cova, Nicola Delmonte, Roberto Menozzi:
Heat management for power converters in sealed enclosures: A numerical study. Microelectron. Reliab. 49(9-11): 1293-1298 (2009) - 2008
- [j20]Peter Ersland, Roberto Menozzi:
Editorial. Microelectron. Reliab. 48(7): 957 (2008) - [j19]Paolo Cova, Nicola Delmonte, Roberto Menozzi:
Thermal modeling of high frequency DC-DC switching modules: Electromagnetic and thermal simulation of magnetic components. Microelectron. Reliab. 48(8-9): 1468-1472 (2008) - 2007
- [j18]Giovanna Sozzi, Roberto Menozzi:
A review of the use of electro-thermal simulations for the analysis of heterostructure FETs. Microelectron. Reliab. 47(1): 65-73 (2007) - [j17]Nicola Delmonte, B. E. Watts, Giovanni Chiorboli, Paolo Cova, Roberto Menozzi:
Test structures for dielectric spectroscopy of thin films at microwave frequencies. Microelectron. Reliab. 47(4-5): 682-685 (2007) - [j16]Peter Ersland, Roberto Menozzi:
Editorial. Microelectron. Reliab. 47(8): 1155 (2007) - 2006
- [j15]Paolo Cova, Roberto Menozzi, Marco Portesine:
Experimental and numerical study of the recovery softness and overvoltage dependence on p-i-n diode design. Microelectron. J. 37(5): 409-416 (2006) - [j14]Peter Ersland, Roberto Menozzi:
Editorial. Microelectron. Reliab. 46(8): 1217 (2006) - [j13]Paolo Cova, Nicola Delmonte, Roberto Menozzi:
Thermal characterization and modeling of power hybrid converters for distributed power systems. Microelectron. Reliab. 46(9-11): 1760-1765 (2006) - 2005
- [j12]Paolo Cova, Nicola Delmonte, Roberto Menozzi:
On state breakdown in PHEMTs and its temperature dependence. Microelectron. Reliab. 45(9-11): 1605-1610 (2005) - [j11]Peter Ersland, Roberto Menozzi:
Editorial. Microelectron. Reliab. 45(12): 1868 (2005) - 2004
- [j10]Peter Ersland, Roberto Menozzi:
Editorial. Microelectron. Reliab. 44(7): 1031 (2004) - [j9]Paolo Cova, Nicola Delmonte, Giovanna Sozzi, Roberto Menozzi:
Temperature-dependent breakdown and hot carrier stress of PHEMTs. Microelectron. Reliab. 44(9-11): 1381-1385 (2004) - 2003
- [j8]Paolo Cova, Roberto Menozzi, Marco Portesine:
Power p-i-n diodes for snubberless application: H+ irradiation for soft and reliable reverse recovery. Microelectron. Reliab. 43(1): 81-87 (2003) - [j7]Wallace T. Anderson, Roberto Menozzi:
Editorial. Microelectron. Reliab. 43(6): 821 (2003) - 2002
- [j6]Giovanna Sozzi, Roberto Menozzi:
High-electric-field effects and degradation of AlGaAs/GaAs power HFETs: a numerical study. Microelectron. Reliab. 42(1): 53-59 (2002) - [j5]Wallace T. Anderson, Roberto Menozzi:
Editorial. Microelectron. Reliab. 42(7): 995 (2002) - [j4]Paolo Cova, Roberto Menozzi, Maximilian Dammann, T. Feltgen, W. Jantz:
High-field step-stress and long term stability of PHEMTs with different gate and recess lengths. Microelectron. Reliab. 42(9-11): 1587-1592 (2002) - 2001
- [j3]Mattia Borgarino, Roberto Menozzi, Domenico Dieci, Laura Cattani, Fausto Fantini:
Reliability physics of compound semiconductor transistors for microwave applications. Microelectron. Reliab. 41(1): 21-30 (2001) - [j2]Wallace T. Anderson, Roberto Menozzi:
Editorial. Microelectron. Reliab. 41(8): 1101 (2001) - 1990
- [j1]Massimo Lanzoni, Roberto Menozzi, Piero Olivo, Bruno Riccò, Andrea Haardt:
Testing of E2PROM aging and endurance: A case study. Eur. Trans. Telecommun. 1(2): 201-207 (1990)
Conference and Workshop Papers
- 2023
- [c4]Paolo Cova, Nicola Delmonte, Stefano Ferrari, Massimo Lazzaroni, Roberto Menozzi, Danilo Santoro, Marco Simonazzi:
Electrical Vehicle Fleet Management for Industrial Environment with Battery SoH Prediction Through Neural Networks. MetroXRAINE 2023: 323-328 - 2021
- [c3]Marco Simonazzi, Nicola Delmonte, Paolo Cova, Gianluigi Ferrari, Francesco Zanichelli, Roberto Menozzi:
Modeling of a university campus Micro-Grid for optimal planning of renewable generation and storage deployment. ISC2 2021: 1-7 - 2008
- [c2]Federico Alimenti, Domenico Zito, Andrea Boni, Mattia Borgarino, Alessandro Fonte, Alessandro Carboni, Salvatore Leone, Marco Pifferi, Luca Roselli, Bruno Neri, Roberto Menozzi:
System-on-chip microwave radiometer for thermal remote sensing and its application to the forest fire detection. ICECS 2008: 1265-1268 - 1990
- [c1]Roberto Menozzi, Massimo Lanzoni, Luca Selmi, Bruno Riccò:
An improved procedure to test CMOS ICs for latch-up. ITC 1990: 1028-1034
Coauthor Index
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