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"Temperature-dependent reverse-bias stress of normally-off GaN power FETs."

Francesco Giuliani et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.068

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/GiulianiDCM13
Francesco Giuliani, Nicola Delmonte, Paolo Cova, Roberto Menozzi:
Temperature-dependent reverse-bias stress of normally-off GaN power FETs. Microelectron. Reliab. 53(9-11): 1486-1490 (2013)

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