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"Analysis of the gate current as a suitable indicator for FET degradation ..."
Antonio Raffo et al. (2011)
- Antonio Raffo
, Sergio Di Falco, Giovanna Sozzi
, Roberto Menozzi
, Dominique M. M.-P. Schreurs
, Giorgio Vannini
:
Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime. Microelectron. Reliab. 51(2): 235-239 (2011)
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