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ORCIDSidi Ahmed Benhassain
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2010 – 2019
- 2017
[c11]Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, Sylvie Naudet, Abhishek Jain, C. R. Parthasarathy, Alain Bravaix
:
Dynamic aging compensation and Safety measures in Automotive environment. IOLTS 2017: 106-112- [c10]Florian Cacho, Ahmed Benhassain, Riddhi Jitendrakumar Shah, Souhir Mhira, Vincent Huard, Lorena Anghel:
Investigation of critical path selection for in-situ monitors insertion. IOLTS 2017: 247-252 - [c9]Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, David Meyer, Sylvie Naudet, Abhishek Jain, C. R. Parthasarathy, Alain Bravaix:
Cognitive approach to support dynamic aging compensation. ITC 2017: 1-7 - 2016
- [c8]Ahmed Benhassain, Florian Cacho, Vincent Huard, Lorena Anghel:
Early failure prediction by using in-situ monitors: Implementation and application results. ERMAVSS@DATE 2016: 21-24 - [c7]Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel:
Workload Impact on BTI HCI Induced Aging of Digital Circuits: A System level Analysis. ERMAVSS@DATE 2016: 38-40 - [c6]Ajith Sivadasan, Florian Cacho, Sidi Ahmed Benhassain, Vincent Huard, Lorena Anghel:
Study of workload impact on BTI HCI induced aging of digital circuits. DATE 2016: 1020-1021 - [c5]Florian Cacho, Ahmed Benhassain, Souhir Mhira, Ajith Sivadasan, Vincent Huard, P. Cathelin, Vincent Knopik, Abhishek Jain, C. R. Parthasarathy, Lorena Anghel:
Activity profiling: Review of different solutions to develop reliable and performant design. IOLTS 2016: 47-50 - [c4]Ahmed Benhassain, Souhir Mhira, Florian Cacho, Vincent Huard, Lorena Anghel:
In-situ slack monitors: taking up the challenge of on-die monitoring of variability and reliability. IVSW 2016: 1-5 - [c3]Lorena Anghel, Ahmed Benhassain, Ajith Sivadasan, Florian Cacho, Vincent Huard:
Early system failure prediction by using aging in situ monitors: Methodology of implementation and application results. VTS 2016: 1 - 2015
- [c2]Ahmed Benhassain, Florian Cacho, Vincent Huard, M. Saliva, Lorena Anghel, C. R. Parthasarathy, Abhishek Jain, Fabien Giner:
Timing in-situ monitors: Implementation strategy and applications results. CICC 2015: 1-4 - [c1]M. Saliva, Florian Cacho, Vincent Huard, X. Federspiel, D. Angot, Ahmed Benhassain, Alain Bravaix, Lorena Anghel:
Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI. DATE 2015: 441-446
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