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ORCIDRafael B. Schvittz
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Journal Articles
- 2023
[j1]Tiago R. Balen
, Carlos J. González, Ingrid F. V. Oliveira, Leomar S. da Rosa Jr., Rafael Iankowski Soares, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen:
Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems. J. Electron. Test. 39(4): 409-420 (2023)
Conference and Workshop Papers
- 2023
- [c17]Bernardo Borges Sandoval, Leonardo Heitich Brendler, Fernanda Lima Kastensmidt, Ricardo Reis, Alexandra L. Zimpeck, Rafael B. Schvittz, Cristina Meinhardt:
Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation. ISCAS 2023: 1-5 - 2022
- [c16]Ingrid F. V. Oliveira, Matheus F. Pontes, Rafael B. Schvittz, Leomar S. da Rosa Jr., Paulo F. Butzen, Rafael Iankowski Soares:
Fault Tolerance Evaluation of Different Majority Voter Designs. ISCAS 2022: 185-189 - [c15]Matheus F. Pontes, Ingrid F. V. Oliveira, Rafael B. Schvittz, Leomar Soares da Rosa Jr., Paulo F. Butzen:
The Impact of Logic Gates Susceptibility in Overall Circuit Reliability Analysis. ISCAS 2022: 1610-1614 - [c14]Clayton R. Farias, Rafael B. Schvittz, Tiago R. Balen, Paulo F. Butzen:
Evaluating Soft Error Reliability of Combinational Circuits Using a Monte Carlo Based Method. LATS 2022: 1-6 - [c13]Rafael N. M. Oliveira, Fábio G. R. G. da Silva, Ricardo Reis, Rafael B. Schvittz, Cristina Meinhardt:
Improving Soft Error Robustness of Full Adder Circuits with Decoupling Cell and Transistor Sizing. SBCCI 2022: 1-6 - 2021
- [c12]Tiago R. Balen, Carlos J. González, Ingrid F. V. Oliveira, Rafael B. Schvittz, Nemitala Added, Eduardo L. A. Macchione, Vitor A. P. de Aguiar, Marcilei Aparecida Guazzelli, Nilberto H. Medina, Paulo F. Butzen:
Reliability Evaluation of Voters for Fault Tolerant Approximate Systems. LATS 2021: 1-6 - 2020
- [c11]Rafael B. Schvittz, Paulo F. Butzen, Leomar S. da Rosa:
Methods for Susceptibility Analysis of Logic Gates in the Presence of Single Event Transients. ITC 2020: 1-9 - 2019
- [c10]Rafael B. Schvittz, Denis Teixeira Franco, Leomar S. da Rosa, Paulo F. Butzen:
An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults. VLSI-SoC (Selected Papers) 2019: 69-88 - [c9]Rafael B. Schvittz, Denis Teixeira Franco, Leomar Soares, Paulo Francisco Butzen:
A Simplified Layout-Level method for Single Event Transient Faults Susceptibility on Logic Gates. VLSI-SoC 2019: 185-190 - [c8]Rafael B. Schvittz, Leomar Soares, Paulo Francisco Butzen:
Exploring Logic Gates Layout to Improve the Accuracy of Circuit Reliability Estimation. VLSI-SoC 2019: 234-235 - 2018
- [c7]Rafael B. Schvittz, Denis Teixeira Franco, Leomar S. da Rosa Jr., Paulo F. Butzen:
Probabilistic Method for Reliability Estimation of SP- Networks considering Single Event Transient Faults. ICECS 2018: 357-360 - [c6]Matheus F. Pontes, Paulo F. Butzen, Rafael B. Schvittz, Leomar S. da Rosa Jr., Denis Teixeira Franco:
The Suitability of the SPR-MP Method to Evaluate the Reliability of Logic Circuits. ICECS 2018: 433-436 - [c5]Rafael B. Schvittz, Matheus F. Pontes, Cristina Meinhardt, Denis Teixeira Franco, Lirida A. B. Naviner, Leomar S. da Rosa, Paulo F. Butzen:
Reliability evaluation of circuits designed in multi- and single-stage versions. LASCAS 2018: 1-4 - [c4]Ingrid F. V. Oliveira, Rafael B. Schvittz, Paulo F. Butzen:
Fault masking ratio analysis of majority voters topologies. LATS 2018: 1-6 - 2016
- [c3]Rafael B. Schivittz, Denis Teixeira Franco, Cristina Meinhardt, Paulo F. Butzen:
A probabilistic model for stuck-on faults in combinational logic gates. LATS 2016: 39-44 - [c2]Rafael B. Schivittz, Rafael Fritz, Denis Teixeira Franco, Lirida A. B. Naviner, Cristina Meinhardt, Paulo F. Butzen:
Inserting permanent fault input dependence on PTM to improve robustness evaluation. SBCCI 2016: 1-6 - 2015
- [c1]Rafael B. Schivittz, Cristina Meinhardt, Paulo F. Butzen:
An evaluation of BTI degradation of 32nm standard cells. ICECS 2015: 661-664
Coauthor Index
aka: Paulo Francisco Butzen
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