"An Improved Technique for Logic Gate Susceptibility Evaluation of Single ..."

Rafael B. Schvittz et al. (2019)

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DOI: 10.1007/978-3-030-53273-4_4

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-03

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Rafael B. Schvittz, Denis Teixeira Franco, Leomar S. da Rosa, Paulo F. Butzen:
An Improved Technique for Logic Gate Susceptibility Evaluation of Single Event Transient Faults. VLSI-SoC (Selected Papers) 2019: 69-88

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