"A Simplified Layout-Level method for Single Event Transient Faults ..."

Rafael B. Schvittz et al. (2019)

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DOI: 10.1109/VLSI-SOC.2019.8920333

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Rafael B. Schvittz, Denis Teixeira Franco, Leomar Soares, Paulo Francisco Butzen:
A Simplified Layout-Level method for Single Event Transient Faults Susceptibility on Logic Gates. VLSI-SoC 2019: 185-190

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