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Justyna Zawada
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2020 – today
- 2022
- [j5]Chong-Siao Ye
, Shi-Xuan Zheng
, Fong-Jyun Tsai
, Chen Wang
, Kuen-Jong Lee
, Wu-Tung Cheng
, Sudhakar M. Reddy, Justyna Zawada
, Mark Kassab, Janusz Rajski
:
Efficient Test Compression Configuration Selection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(7): 2323-2336 (2022) - 2020
- [c9]Uri Shpiro, Khen Wee, Kun-Han Tsai, Justyna Zawada, Xijiang Lin:
Test Challenges of Intel IA Cores. ITC 2020: 1-5 - [c8]Fong-Jyun Tsai, Chong-Siao Ye
, Kuen-Jong Lee, Shi-Xuan Zheng, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Chen Wang, Justyna Zawada:
Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations. ITC 2020: 1-10
2010 – 2019
- 2019
- [j4]Elham K. Moghaddam
, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
, Justyna Zawada:
Logic BIST With Capture-Per-Clock Hybrid Test Points. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(6): 1028-1041 (2019) - 2018
- [j3]Michael Chen, Elham K. Moghaddam
, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer
, Justyna Zawada:
Hardware Protection via Logic Locking Test Points. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(12): 3020-3030 (2018) - [c7]Janusz Rajski, Jerzy Tyszer, Justyna Zawada:
On New Class of Test Points and Their Applications. ITC 2018: 1-9 - 2017
- [j2]Cesar Acero, Derek Feltham, Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Marek Patyra, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer
, Justyna Zawada:
Embedded Deterministic Test Points. IEEE Trans. Very Large Scale Integr. Syst. 25(10): 2949-2961 (2017) - [c6]Sylwester Milewski, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada:
Full-scan LBIST with capture-per-cycle hybrid test points. ITC 2017: 1-9 - 2016
- [j1]Cesar Acero, Derek Feltham, Marek Patyra, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Janusz Rajski, Jerzy Tyszer, Justyna Zawada:
On New Test Points for Compact Cell-Aware Tests. IEEE Des. Test 33(6): 7-14 (2016) - [c5]Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada:
On Test Points Enhancing Hardware Security. ATS 2016: 61-66 - [c4]Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada:
Test point insertion in hybrid test compression/LBIST architectures. ITC 2016: 1-10 - 2015
- [c3]Haluk Konuk, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Deepak Solanki, Jerzy Tyszer, Justyna Zawada:
Design for low test pattern counts. DAC 2015: 136:1-136:6 - [c2]Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada:
Embedded deterministic test points for compact cell-aware tests. ITC 2015: 1-8 - 2014
- [c1]Albert Au, Artur Pogiel, Janusz Rajski, Piotr Sydow, Jerzy Tyszer, Justyna Zawada:
Quality assurance in memory built-in self-test tools. DDECS 2014: 39-44
Coauthor Index
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