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Journal Articles
- 2009
[j5]Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
Analysis of Resistive-Open Defects in SRAM Sense Amplifiers. IEEE Trans. Very Large Scale Integr. Syst. 17(10): 1556-1559 (2009)- 2007
- [j4]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. J. Electron. Test. 23(5): 435-444 (2007) - 2006
- [j3]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
, Simone Borri, Magali Bastian Hage-Hassan:
ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions. J. Electron. Test. 22(3): 287-296 (2006) - 2005
- [j2]Simone Borri, Magali Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel:
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. J. Electron. Test. 21(2): 169-179 (2005) - [j1]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Hage-Hassan:
Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. J. Electron. Test. 21(5): 551-561 (2005)
Conference and Workshop Papers
- 2009
- [c17]Alexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin:
A new design-for-test technique for SRAM core-cell stability faults. DATE 2009: 1344-1348 - 2008
- [c16]Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin:
A Design-for-Diagnosis Technique for SRAM Write Drivers. DATE 2008: 1480-1485 - [c15]Michael Yap San Min, Philippe Maurine, Magali Bastian, Michel Robert:
A Novel Dummy Bitline Driver for Read Margin Improvement in an eSRAM. DELTA 2008: 107-110 - [c14]Michael Yap San Min, Philippe Maurine, Magali Bastian, Michel Robert:
Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects. ISVLSI 2008: 310-315 - [c13]Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs. ITC 2008: 1-10 - [c12]Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin:
An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. VTS 2008: 89-94 - 2007
- [c11]Magali Bastian, Vincent Gouin, Patrick Girard, Christian Landrault, Alexandre Ney, Serge Pravossoudovitch, Arnaud Virazel:
Influence of Threshold Voltage Deviations on 90nm SRAM Core-Cell Behavior. ATS 2007: 507-510 - [c10]Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
Slow write driver faults in 65nm SRAM technology: analysis and March test solution. DATE 2007: 528-533 - [c9]Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. ETS 2007: 97-104 - [c8]Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. VTS 2007: 361-368 - 2006
- [c7]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. DDECS 2006: 256-261 - 2005
- [c6]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. DAC 2005: 857-862 - [c5]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan:
Resistive-open defect influence in SRAM pre-charge circuits: analysis and characterization. ETS 2005: 116-121 - [c4]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan:
Data Retention Fault in SRAM Memories: Analysis and Detection Procedures. VTS 2005: 183-188 - 2004
- [c3]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan:
Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. Asian Test Symposium 2004: 266-271 - [c2]Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan:
Dynamic read destructive fault in embedded-SRAMs: analysis and march test solution. ETS 2004: 140-145 - 2003
- [c1]Simone Borri, Magali Hage-Hassan, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel:
Defect-oriented dynamic fault models for embedded-SRAMs. ETW 2003: 23-28
Coauthor Index
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