"Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test."

Simone Borri et al. (2005)

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DOI: 10.1007/S10836-005-6146-1

access: closed

type: Journal Article

metadata version: 2023-03-21

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Simone Borri, Magali Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel:
Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. J. Electron. Test. 21(2): 169-179 (2005)

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