Manoj Sachdev

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Oleg Semenov

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Publications

2007
[c50]
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Hossein Sarbishaei, Oleg Semenov, Manoj Sachdev:
Optimizing Circuit Performance and ESD Protection for High-Speed Differential I/Os. CICC 2007: 149-152
2006
[j27]
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Oleg Semenov, Hossein Sarbishaei, Valery Axelrad, Manoj Sachdev:
Novel gate and substrate triggering techniques for deep sub-micron ESD protection devices. Microelectron. J. 37(6): 526-533 (2006)
2005
[c37]
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  - conf/isqed/SemenovSS05
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Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev:
Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment. ISQED 2005: 427-432
2004
[j19]
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Oleg Semenov, Michael S. Obrecht, Manoj Sachdev:
Evaluation of STI degradation using temperature dependence of leakage current in parasitic STI MOSFET. Microelectron. Reliab. 44(9-11): 1751-1755 (2004)
[j18]
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Oleg Semenov, Hossein Sarbishaei, Valery Axelrad, Manoj Sachdev:
The Impact of CMOS technology scaling on MOSFETs second breakdown: Evaluation of ESD robustness. Microelectron. Reliab. 44(9-11): 1817-1822 (2004)
2003
[j14]
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Oleg Semenov, Arman Vassighi, Manoj Sachdev:
Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta I_DDQ Testing. J. Electron. Test. 19(3): 341-352 (2003)
[c25]
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Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi:
Thermal Management of High Performance Microprocessors. DFT 2003: 313-319
[c22]
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Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins:
Burn-in Temperature Projections for Deep Sub-micron Technologies. ITC 2003: 95-104
2002
[c21]
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Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi:
Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI. DFT 2002: 12-19

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