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"Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI."
Arman Vassighi et al. (2002)
- Arman Vassighi, Oleg Semenov, Manoj Sachdev, Ali Keshavarzi:
Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI. DFT 2002: 12-19
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