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ORCIDITC 1982: Philadelphia, PA, USA
- Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. IEEE Computer Society 1982
Session 1: Invited Speekers
- Luis T. Burke Jr.:
Maintaing Quality, Poductivity and Profit in a Changing Bell System. ITC 1982: 4-5 - Melissa E. Broussard:
Higher Yields, Lower Costs. ITC 1982: 6-11 - Matthew V. Mahoney:
Closing the Loop: An Expanding Role for ATE in Semiconductor Manufacturing. ITC 1982: 12-23
Session 2: Fault Modeling and Test Effectiveness Evaluation for VLSI Circuits
- Peter S. Bottorff:
Fault Modeling and Test Effectiveness Evaluation for VLSI Circuits. ITC 1982: 24 - Yashwant K. Malaiya, Stephen Y. H. Su:
A New Fault Model and Testing Technique for CMOS Devices. ITC 1982: 25-34 - C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku:
Do Stuck Fault Models Reflect Manufacturing Defects? ITC 1982: 35-42 - Alexander Miczo:
Fault Modelling for Functional Primitives. ITC 1982: 43-51
Session 3: Design for Testability
- Mark G. Karpovsky:
Universal Tests Detecting Input/Output Faults in Almost All Devices. ITC 1982: 52-57 - Erik DeBenedictis, Charles L. Seitz:
Testing and Structured Design. ITC 1982: 58-62 - Sumit DasGupta, Prabhakar Goel, Ron G. Walther, Tom W. Williams:
A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI. ITC 1982: 63-66 - K. S. Ramanatha, Nripendra N. Biswas:
A Design for Complete Testability of Programmable Logic Arrays. ITC 1982: 67-74 - William C. Carter:
Signature Testing with Guaranteed Bounds for Fault Coverage. ITC 1982: 75-82 - Prabhakar Goel, M. T. McMahon:
Electronic Chip-In-Place Test. ITC 1982: 83-91
Session 4: Test Equipment and Methods I
- Joel M. Schoen:
Test Equipment and Methods I. ITC 1982: 92 - William J. Bowhers:
Filtering Methods for Fast Ultra-Low Distortion Measurements. ITC 1982: 93-104 - Yasutoshi Otani, Eiji Ishiwa, Nobuo Arai, Yoshio Yamanaka:
A Pursuit of Superior Cost-Per-Performance in General-Purpose Linear IC Test System. ITC 1982: 105-110 - David C. Cheng, Alexander A. Grillo:
Test Considerations for Components with Redundant Elements. ITC 1982: 111-118 - Kennteth F. Coop:
Automated Test Instrumentation for Low-Current Testing. ITC 1982: 119-125 - Bradford Robbins, David K. Oka:
Using Analog Signature Analysis in Speech Synthesis Device Testing. ITC 1982: 126-131 - K. S. Bhaskar:
Signature Analysis: Yet Another Perspective. ITC 1982: 132-139
Panel Session 7: Professional Aspects of Test Engineering
- John Turino:
Professional Aspects of Test Engineering. ITC 1982: 140-141 - Douglas Greenwood:
Increasing Test Engineering Effectivness. ITC 1982: 142 - James L. Kroening:
Professional Aspects of Test Engineering. ITC 1982: 143-145
Session 8: ATPG and Simulation Systems-The State of the Art.
- Harold Levin:
ATPG and Simulation Systems : The State of the Art. ITC 1982: 146 - Kenneth R. Bowden:
Design Goals and Implementation Techniques for Time-Based Digital Simulation and Hazard Detection. ITC 1982: 147-152 - David Giles, Charles Berking, Kenneth Wacks:
Integrated Functional/Structural Timing for Digital Simulation. ITC 1982: 153-160 - Kyuhik Son, James Y. O. Fong:
Automatic Behavioral Test Generation. ITC 1982: 161-165 - John P. Barlow:
A New Software Tool for Detecting Problems Caused by Inductively-Generated Switching Noise. ITC 1982: 166-169 - James Y. O. Fong:
On Functional Controllability and Observability Analysis. ITC 1982: 170-175 - Charles Hinchcliff:
Simplified Microprocessor Test Generation. ITC 1982: 176-181
Session 9: Self-Test: Chip Level to System Level Approaches
- Richard M. Sedmak:
Self-Test Chip to System Level Approaches. ITC 1982: 182 - Edward J. McCluskey:
Built-In Verification Test. ITC 1982: 183-190 - Thirumalai Sridhar, Satish M. Thatte:
Concurrent Checking of Program Flow in VLSI Processors. ITC 1982: 191-199 - Paul H. Bardell, William H. McAnney:
Self-Testing of Multichip Logic Modules. ITC 1982: 200-204 - J. Abadir, Yves Deswarte:
Run-Time Program for Self-Checking Single Board Computer. ITC 1982: 205-213 - Patrick P. Fasang:
A Fault Detection and Isolation Technique for Microcomputers. ITC 1982: 214-222
Session 10: Memory-Test-An International Art
- D. J. Graham:
Memory Test : An International Art. ITC 1982: 223-224 - Eugene R. Hnatek, Beau R. Wilson Jr.:
An Evaluation of the 2816 EEPROM. ITC 1982: 225-235 - Marian Marinescu:
Simple and Efficient Algorithms for Functional RAM Testing. ITC 1982: 236-239 - Y. Hayasaka, K. Shimotori, K. Okada:
Testing System for Redundant Memory. ITC 1982: 240-244 - T. Tada, T. Kobayashi, K. Okada, Y. Kuramitsu:
Testing of Sense Amplifier in Dynamic Memory. ITC 1982: 245-251 - Nik Kirschner:
An Interactive Descrambler Program for RAMs with Redundancy. ITC 1982: 252-257 - Charles E. Shalvoy:
Testing during Burn-In: Economical Alternative for Testing Memories. ITC 1982: 258-261
Session 11: Quality and Reliability
- Bill Hedrick:
Quality and Reliability. ITC 1982: 262 - Joel P. LeBlanc Jr.:
An STL Gate Array Reliability Test Bar. ITC 1982: 263-268 - Louis J. Sobotka:
The Effects of Backdriving Digital Integrated Circuits during In-Circuit Testing. ITC 1982: 269-286 - G. Eugene Gottlieb:
An Accelerated Testing Technique for Plastic Package Devices Using a Sequential Combination of Pressure Cooker and 85/85 (PCTH). ITC 1982: 287-298 - Willis J. Horth, Frederick G. Hall, Robert G. Hillman:
Microelectronic Device Electrical Test Implementation Problems on Automated Test Equipment. ITC 1982: 299-307 - F. G. Cockerill:
Quality Control for Production Testing. ITC 1982: 308-314 - Kemon P. Taschioglou:
To Measure Quality in the Manufacturing of Printed Circuit Boards. ITC 1982: 315-325
Session 12: Test Data Analysis Closes the Production Loop
- R. Burgess, E. Pignetti, J. Pitti:
MCM Data Analysis Tracking System. ITC 1982: 326-330 - Wayne Bryant, Charles Furry, Jim Hahn:
Benefits of ATE and Host Computer Networking. ITC 1982: 331-338 - Bruce G. MacAloney, Paul Littlejohn:
Manufacturing Productivity: Automated vs. Manual Test-Data-Management Systems. ITC 1982: 339-345 - David W. Malas, Stephen C. Hagan:
Test Data Automation: An ATE Distributed Processing Application in a Multi-Vendor Environment. ITC 1982: 346-349 - W. L. Goldie, P. F. Macready:
An Automatic Test Equipment Database System Used in the Generation and Analysis of Fault Statistics at the Printed Circuit Board Level. ITC 1982: 350-361
Session 13: Testability Measurement and Enhancement
- William C. Berg, Robert D. Hess:
COMET: A Testability Analysis and Design Modification Package. ITC 1982: 364-378 - Eugen I. Muehldorf, Thomas W. Williams:
Analysis of the Switching Behavior of Combinatorial Logic Networks. ITC 1982: 379-390 - Vishwani D. Agrawal, M. Ray Mercer:
Testability Measures : What Do They Tell Us ? ITC 1982: 391-399 - Ion M. Ratiu, Alberto L. Sangiovanni-Vincentelli, Donald O. Pederson:
VICTOR : A Fast VLSI Testability Analysis Program. ITC 1982: 397-403
Session 14: Systems Tools
- Richard A. Albright:
System Test. ITC 1982: 404 - John A. Masciola, Mark S. Lucas:
A Technique for Testing Large Distributed Systems. ITC 1982: 405-408 - Ken Fedraw:
9826A Computer Burn-In Program. ITC 1982: 409-413 - Donald Komonytsky:
LSI Self-Test Using Level Sensitive Scan Design and Signature Analysis. ITC 1982: 414-424 - Kenneth R. Willey:
Systems Testing Why ? ITC 1982: 425-427
Session 15: Computer Enhanced Analog Test Techniques
- David C. Cheng:
A Precision Measurement Technique for High Frequency Repetitive Signals. ITC 1982: 428-434 - K. Uchida:
Testing the Dynamic Performance of High-Speed A/D Converters. ITC 1982: 435-440 - Stephen W. Bryson:
Testing an Audio Spectrum Analyzer for Speech Recognition Systems. ITC 1982: 441-446 - Tim Higgins:
Digital Signal Processing for Production Testing of Analog LSI Devices. ITC 1982: 447-457
Session 16: VLSI/MicroprocessorTests-Making Micrprocessors More Testable
- Bell Liu:
Soft Failure Detection and Correction in Microprocessor Characterization. ITC 1982: 458-460 - Masood Namjoo:
Techniques for Concurrent Testing of VLSI Processor Operation. ITC 1982: 461-468 - Vijay S. Iyengar, Larry L. Kinney:
Concurrent Testing of Flow of Control in Simple Microprogrammed Control Units. ITC 1982: 469-479 - Sunil Nanda, Sudhakar M. Reddy:
Design of Easily Testable Microprocessors : A Case Study. ITC 1982: 480-483 - Satish M. Thatte, D. S. Ho, H.-T. Yuan, Thirumalai Sridhar, Theo J. Powell:
An Architecture for Testable VLSI Processors. ITC 1982: 484-493
Session 17: Test Software
- Roger Simpson:
Test Software. ITC 1982: 494 - Antony K. Stevens:
Structured Programming and the I.C. Test Engineer. ITC 1982: 495-4 - I. M. Watson, John A. Newkirk, Robert G. Mathews, D. B. Boyle:
ICTEST : A Unified System for Functional Testing and Simulation of Digital ICs. ITC 1982: 499-502 - Jaques Couesnon, Michel Parot:
A Coherent and Efficient Approach to LSI Modeling and Testing for Integrated Circuit Users. ITC 1982: 503-508 - Richard C. Mahoney:
A Common Pascal Test Language: Reality or Pipedream. ITC 1982: 509-513 - Iqbal Syed, Nicole Rose:
Automated Generation of Device Test Software. ITC 1982: 514-521 - Mike Schell, Mike Sigler:
Automated Analysis of Static RAM Failures. ITC 1982: 522-527
Session 18: Board Testing I
- Reymon Oberly:
Board Testing. ITC 1982: 528 - Eric H. Millham:
Board Test Session I. ITC 1982: 529 - Matthew L. Fichtenbaum:
Faults Which Challenge the In-Circuit Tester: Some Examples and Some Solutions. ITC 1982: 530-536 - T. Jackson, P. Vais, K. Schwerbrock:
A New Approach to On-Board Microprocessor-Based Self-Test. ITC 1982: 537-540 - Herold Levine, Charles Berking, Alan Blair, Kenneth R. Bowden, Peter deBruyn Kops, David Giles, David Ruhoff, Kenneth Wacks:
Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards. ITC 1982: 541-547 - Dennis Hebert, Jack H. Arabian:
Implications of the Technique for Dynamic High Speed Functional Testing. ITC 1982: 548-557
Session 19: Test Economics
- Gregory Illes:
Test System Remote Program Management. ITC 1982: 558-564 - Donald Stewart:
Improving the Effectiveness of Board Test Programmers. ITC 1982: 565-568 - William K. Jones:
Managing Your Test Cost for the 80's. ITC 1982: 569-573 - G. A. Perone, R. S. Maljatt, J. P. Kain, W. I. Goodheim:
A Closer Look at Testing Costs. ITC 1982: 574-579
Session 20: VLSI/Microprocessor Tests-New Approaches
- Ming-Guan Lin, Kenneth Rose:
Applying Test Theory to VLSI Testing. ITC 1982: 580-586 - William S. Richardson:
Test Pattern Portability for Microprocessors. ITC 1982: 587-589 - Neal H. MacDonald, Gordon B. Neish:
An Algorithmic Approach to the Testing of a Wafer Scale Integrated (WSI) Circuit. ITC 1982: 590-600 - Roderick H. Macmillan, M. R. Bentley:
, An Efficient Test Vector Generation and Reduction Method for an LSI Digital Filter Circuit Using an Adaptive Search Technique. ITC 1982: 601-607
Session 21: Test Equipment and Methods II
- Richard B. Craven:
Test Equipment and Methods II. ITC 1982: 608 - Brian C. Crosby:
ECL Board Testing: An In-Circuit Point of View. ITC 1982: 609-614 - Thomas A. Senna:
Calculating VOH for LSI 10K ECL. ITC 1982: 615-619 - James Seaton, Jeffrey Axelbank:
Designing a High-Speed Vector Bust to Meet the Requirements of Analog LSI Testing. ITC 1982: 620-627 - Junji Nishiura, Toshio Maruyama, Hiromi Maruyama, Shinpei Kamata:
Testing VLSI Microprocessor with New Functional Capability. ITC 1982: 628-633 - K. Thangamuthu, M. Macari, S. Cohen:
Automated Contactless Digital Test System for VLSI. ITC 1982: 634-639
Session 22: Board Testing II
- R. Oberly:
Board Testing II. ITC 1982: 640 - James J. Faran Jr.:
Methods of Assignment of Nodes to Pins for Multiplexed Testers. ITC 1982: 641-647 - Hookuong Wong, David Florcik:
A Tester-Independent Automated Test Preparation Process for Loaded Boards. ITC 1982: 648-655 - Thirumalai Sridhar, D. S. Ho, Theo J. Powell, Satish M. Thatte:
Analysis and Simulation of Parallel Signature Analyzers. ITC 1982: 656-661 - Peter Solecky, Frank C. Hsu:
Board Diagnosis: A Current Assessment and Direction for Future Improvement. ITC 1982: 662-670
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