"Design of a New Test Generation System for Performance Testing of LSI ..."

Herold Levine et al. (1982)

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type: Conference or Workshop Paper

metadata version: 2002-11-11

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Herold Levine, Charles Berking, Alan Blair, Kenneth R. Bowden, Peter deBruyn Kops, David Giles, David Ruhoff, Kenneth Wacks:
Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards. ITC 1982: 541-547

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