2. DELTA 2004:
Perth, Australia DfT and BIST
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conf/delta/VenkateswaranB04
Signal & Image Processing Systems
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Special Session on Opto-VLSI and MicroPhotonics
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Special Session on FPGA
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conf/delta/ChandranKSOV04 export record as
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Analog & Mixed-Signal Design
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conf/delta/StojcevskiSZ04 export record as
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Real-Time Systems
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Yao Li :
The Slack Sharing Server for Embedded Microcontrollers.
121-125
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Special Session on Education in Electronics
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conf/delta/FlottesBBLBNCPPW04 Marie-Lise Flottes ,
Yves Bertrand ,
L. Balado ,
Emili Lupon ,
Anton Biasizzo ,
Franc Novak ,
Stefano Di Carlo ,
Paolo Prinetto ,
N. Pricopi ,
Hans-Joachim Wunderlich :
Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ.
135-139
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Bernard Courtois :
Infrastructures for Education, Research and Industry in Microelectronics - A review.
149-156
Communications 1
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Xiaoyong Yang :
A Feasibility Study Of UML In The Software Defined Radio.
157-162
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Xiaoyong Yang :
An Enhanced SOFM Method for Automatic Recognition and Identification of Digital Modulations.
174-182
Current Testing
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conf/delta/HashizumeAYT04 export record as
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conf/delta/TsukimotoHYT04 export record as
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Special Session on Opto-VLSI and MicroPhotonics 2
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Advanced Design Solutions
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Digital Systems and Circuits
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Huaping Liu ,
Han Chengde :
Optimization of Multipartite Table Methods to Approximate the Elementary Functions.
261-268
Scan Testing
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conf/delta/YotsuyanagiKNHK04 export record as
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conf/delta/BonhommeGGLPV04
Application Specific Circuits and Systems
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Gerald Esch Jr. ,
Tom Chen :
Design of CMOS IO Drivers with Less Sensitivity to Process, Voltage, and Temperature Variations.
312-320
Fault Tolerance
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Open Architecture Test System
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Analog Design Techniques
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Communications 2
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conf/delta/BhattacharyaSCC04 export record as
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Special Session on Opto-VLSI and MicroPhotonics 3
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conf/delta/AlamehBAREZZW04 export record as
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Poster Papers
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Ganesh Kothapalli :
Excitation Modes and Transient Response of a Winner-take-all Circuit.
403-406
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David Murfett :
The Challenge of Testing RFID Integrated Circuits .
410-412
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Shyue-Kung Lu ,
Mau-Jung Lu :
Enhancing Delay Fault Testability for FIR Filters Based on Realistic Sequential Cell Fault Model.
416-418
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conf/delta/BrognaBBEGPS04 export record as
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