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Publication search results
found 50 matches
- 2017
- Ahmad Bahai:
Keynote address: Opening keynote. VTS 2017: 1 - Bonita Bhaskaran, Sailendra Chadalavada, Shantanu Sarangi, Nithin Valentine, Venkat Abilash Reddy Nerallapally, Ayub Abdollahian:
At-speed capture global noise reduction & low-power memory test architecture. VTS 2017: 1-6 - Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker:
Efficient SAT-based generation of hazard-activated TSOF tests. VTS 2017: 1-6 - Shravan K. Chaganti, Li Xu, Degang Chen:
A low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter. VTS 2017: 1-6 - Athanasios Chatzidimitriou, Manolis Kaliorakis, Sotiris Tselonis, Dimitris Gizopoulos:
Performance-aware reliability assessment of heterogeneous chips. VTS 2017: 1-6 - Yun Cheng, Huawei Li, Ying Wang, Yingke Gao, Bo Liu, Xiaowei Li:
Flip-flop clustering based trace signal selection for post-silicon debug. VTS 2017: 1-6 - Kun Young Chung, Stefano Di Carlo:
Innovative practices session 9C DFT and data for diagnostics. VTS 2017: 1 - Jyotirmoy V. Deshmukh, Wolfgang Kunz, Hans-Joachim Wunderlich, Sybille Hellebrand:
Special session on early life failures. VTS 2017: 1 - Roya Dibaj, Dhamin Al-Khalili, Maitham Shams:
Comprehensive investigation of gate oxide short in FinFETs. VTS 2017: 1-6 - Yan Duan, Degang Chen:
Accurate jitter decomposition in high-speed links. VTS 2017: 1-6 - Kelson Gent, Akash Agrawal, Michael S. Hsiao:
A framework for fast test generation at the RTL. VTS 2017: 1-6 - Prashant Goteti, Sreejit Chakravarty:
Innovative practices session 6C DFT for functional safety. VTS 2017: 1 - Ujjwal Guin, Ziqi Zhou, Adit D. Singh:
A novel design-for-security (DFS) architecture to prevent unauthorized IC overproduction. VTS 2017: 1-6 - Sandeep Gupta, Miron Abramovici, Magdy Abadir, Sridhar Narayanan:
Keynote address tribute to Professor Mel Breuer: Contributions to CAD and Test. VTS 2017: 1 - Kazumi Hatayama, Masahiro Ishida:
Innovative practices session 9B innovative practices in Asia-1: From quality perspective. VTS 2017: 1 - Kazumi Hatayama, Masahiro Ishida:
Innovative practices session 10B innovative practices in Asia-2: From cost perspective. VTS 2017: 1 - Yu Huang:
Innovative practices session 11C SoC testing. VTS 2017: 1 - Yu-Hao Huang, Ching-Ho Lu, Tse-Wei Wu, Yu-Teng Nien, Ying-Yen Chen, Max Wu, Jih-Nung Lee, Mango C.-T. Chao:
Methodology of generating dual-cell-aware tests. VTS 2017: 1-6 - Ahmed Ibrahim, Hans G. Kerkhoff:
Structured scan patterns retargeting for dynamic instruments access. VTS 2017: 1-6 - Md. Nazmul Islam, Sandip Kundu:
An analytical model for predicting the residual life of an IC and design of residual-life meter. VTS 2017: 1-6 - Dae-Hyun Kim, Linda Milor:
A methodology for estimating memory lifetime using a system-level accelerated life test and error-correcting codes. VTS 2017: 1-6 - Deepak Krishnankutty, Ryan W. Robucci, Nilanjan Banerjee, Chintan Patel:
Fiscal: Firmware identification using side-channel power analysis. VTS 2017: 1-6 - Kao-Chi Lee, Kai-Chiang Wu, Chih-Ying Tsai, Mango Chia-Tso Chao:
Fast WAT test structure for measuring Vt variance based on latch-based comparators. VTS 2017: 1-6 - Zipeng Li, Jonathon E. Colburn, Vinod Pagalone, Kaushik Narayanun, Krishnendu Chakrabarty:
Test-cost optimization in a scan-compression architecture using support-vector regression. VTS 2017: 1-6 - Huawei Li, Xiaowei Li:
Innovative practices session 10C formal verification practices in industry. VTS 2017: 1 - Chang Liu, Michael A. Kochte, Hans-Joachim Wunderlich:
Aging monitor reuse for small delay fault testing. VTS 2017: 1-6 - Yichuan Lu, Georgios Volanis, Kiruba S. Subramani, Angelos Antonopoulos, Yiorgos Makris:
Knob non-idealities in learning-based post-production tuning of analog/RF ICs: Impact & remedies. VTS 2017: 1-6 - Yiorgos Makris, Srivaths Ravi, Amit Majumdar:
Foreword. VTS 2017: 1-2 - Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee:
On-line diagnosis and compensation for parametric failures in linear state variable circuits and systems using time-domain checksum observers. VTS 2017: 1-6 - Suriya Natarajan, Abhijit Sathaye:
Innovative practices session 4C data analytics in test. VTS 2017: 1
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