• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 26 matches

• 2023
• 
  Pratishtha Agnihotri, Lawrence M. Schlitt, Priyank Kalla, Steve Blair:
  Abstractions for Modeling the Effects of Wall Surface Roughness in Silicon Photonic Microring Resonators. LATS 2023: 1-6
• 
  Foisal Ahmed, Maksim Jenihhin:
  Holistic IJTAG-based External and Internal Fault Monitoring in UAVs. LATS 2023: 1-6
• 
  Chandramouli N. Amarnath, Abhijit Chatterjee:
  Error Resilient Neuromorphic Systems Using Embedded Predictive Neuron Checks. LATS 2023: 1-2
• 
  Francesco Angione, Paolo Bernardi, Riccardo Cantoro, Nicola Di Gruttola Giardino, Davide Piumatti, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre:
  On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. LATS 2023: 1-6
• 
  Nicolò Bellarmino, Riccardo Cantoro, Martin Huch, Tobias Kilian, Ulf Schlichtmann, Giovanni Squillero:
  Feature Selection for Cost Reduction In MCU Performance Screening. LATS 2023: 1-6
• 
  Paolo Bernardi, Gabriele Filipponi, Tommaso Foscale, Giorgio Insinga:
  Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests. LATS 2023: 1-2
• 
  Víctor H. Champac, Freddy Forero, Michel Renovell, Leonardo Miceli:
  A New Defect Model due to a Dust Particle Affecting the Fingers of FinFET Logic Gates. LATS 2023: 1-6
• 
  Pooja Choudhary, Lava Bhargava, Masahiro Fujita, Virendra Singh:
  LUT-based Arithmetic Circuit Approximation with Formal Guarantee on Worst Case Relative Error. LATS 2023: 1-2
• 
  Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Edward Javier Patiño Nuñez, Robert Limas Sierra, Matteo Sonza Reorda:
  Analyzing the Architectural Impact of Transient Fault Effects in SFUs of GPUs. LATS 2023: 1-6
• 
  Thiago Santos Copetti, A. Castelnuovo, Tobias Gemmeke, Letícia Maria Veiras Bolzani:
  Evaluating a New RRAM Manufacturing Test Strategy. LATS 2023: 1-6
• 
  Edilson Filho, Jarbas Silveira, César A. M. Marcon:
  Blockchain Applied In Decentralization of Ground Stations To Educational Nanosatellites. LATS 2023: 1-5
• 
  Esther Goudet, Luis Peña Treviño, Lirida A. B. Naviner, Jean-Marc Daveau, Philippe Roche:
  Fast analysis of combinatorial netlists correctness rate based on binomial law and partitioning. LATS 2023: 1-6
• 
  G. Govarini, Annachiara Ruospo, Edgar E. Sánchez:
  A Fast Reliability Analysis of Image Segmentation Neural Networks Exploiting Statistical Fault Injections. LATS 2023: 1-6
• 
  Xinhui Lai, Maksim Jenihhin:
  Analyzing Side-Channel Attack Vulnerabilities at RTL. LATS 2023: 1-2
• 
  Christo A. Lara, Maximiliano Fragoso, Luis Manuel Juárez, Leonardo Barboni, Rigoberto Reyes, Ricardo Vázquez, Julio Pérez Acle, Saúl de la Rosa:
  Fault Tolerant Architecture Design of a CubeSat Command and Data Handling System. LATS 2023: 1-6
• 
  Erik Larsson:
  Co-optimization of security and accessibility to on-chip instruments. LATS 2023: 1-2
• 
  Manasa Madhvaraj, Salvador Mir, Manuel J. Barragán:
  Special Session: On-chip jitter BIST with sub-picosecond resolution at GHz frequencies. LATS 2023: 1-2
• 
  Ankush Mamgain, Salvador Mir, Jai Narayan Tripathi, Manuel J. Barragán:
  Special Session: A high-frequency sinusoidal signal generation using harmonic cancellation. LATS 2023: 1-2
• 
  Salvatore Pappalardo, Annachiara Ruospo, Ian O'Connor, Bastien Deveautour, Ernesto Sánchez, Alberto Bosio:
  A Fault Injection Framework for AI Hardware Accelerators. LATS 2023: 1-6
• 
  Pablo A. Petrashin, Walter J. Lancioni, Agustin Laprovitta, Fortunato Dualibe, Juan Luis Castagnola:
  Effect of Vth shifting in CMOS Transistors under radiation conditions when applying OBT: A case study. LATS 2023: 1-4
• 
  Sonali Shukla, Bhavika Ranjeet Kumar, Virendra Singh:
  SSSN: Secured Streaming Scan Network. LATS 2023: 1-6
• 
  Adit D. Singh:
  Silent Error Corruption: The New Reliability and Test Challenge. LATS 2023: 1-2
• 
  Felix Staudigl, Thorben Fetz, Rebecca Pelke, Dominik Sisejkovic, Jan Moritz Joseph, Letícia Maria Veiras Bolzani Poehls, Rainer Leupers:
  Invited Paper: A Holistic Fault Injection Platform for Neuromorphic Hardware. LATS 2023: 1-6
• 
  Thibault Vayssade, Florence Azaïs, Laurent Latorre, François Lefèvre:
  Low-cost digital solution for production test of ZigBee transmitters Special Session "AMS-RF testing". LATS 2023: 1-2
• 
  Hans-Joachim Wunderlich, Hanieh Jafarzadeh, Alexandra Kourfali, Natalia Lylina, Zahra Paria Najafi-Haghi:
  Test Aspects of System Health State Monitoring. LATS 2023: 1-2
• 
  24th IEEE Latin American Test Symposium, LATS 2023, Veracruz, Mexico, March 21-24, 2023. IEEE 2023, ISBN 979-8-3503-2597-3 [contents]