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"A New Defect Model due to a Dust Particle Affecting the Fingers of FinFET ..."

Víctor H. Champac et al. (2023)

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DOI: 10.1109/LATS58125.2023.10154490

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-28

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Víctor H. Champac, Freddy Forero, Michel Renovell, Leonardo Miceli:
A New Defect Model due to a Dust Particle Affecting the Fingers of FinFET Logic Gates. LATS 2023: 1-6

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