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Freddy Forero
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2020 – today
- 2023
- [j4]Freddy Forero, Víctor H. Champac, Michel Renovell:
B-open Defect: A Novel Defect Model in FinFET Technology. ACM J. Emerg. Technol. Comput. Syst. 19(1): 3:1-3:19 (2023) - [c7]Víctor H. Champac, Freddy Forero, Michel Renovell, Leonardo Miceli:
A New Defect Model due to a Dust Particle Affecting the Fingers of FinFET Logic Gates. LATS 2023: 1-6
2010 – 2019
- 2019
- [j3]Freddy Forero, Hector Villacorta, Michel Renovell, Víctor H. Champac:
Modeling and Detectability of Full Open Gate Defects in FinFET Technology. IEEE Trans. Very Large Scale Integr. Syst. 27(9): 2180-2190 (2019) - [c6]Freddy Forero, Michel Renovell, Víctor H. Champac:
B-open: A New Defect in Nanometer Technologies due to SADP Process. ETS 2019: 1-2 - [c5]Freddy Forero, Jean-Marc Gallière, Michel Renovell, Víctor H. Champac:
A Semi-analytical Model for Interconnect Open Defects in FinFET Logic Cells. LATS 2019: 1-6 - 2018
- [j2]Freddy Forero, Jean-Marc Gallière, Michel Renovell, Víctor H. Champac:
Detectability Challenges of Bridge Defects in FinFET Based Logic Cells. J. Electron. Test. 34(2): 123-134 (2018) - [c4]Andres F. Gomez, Freddy Forero, Kaushik Roy, Víctor H. Champac:
Robust Detection of Bridge Defects in STT-MRAM Cells Under Process Variations. VLSI-SoC 2018: 65-70 - [c3]Víctor H. Champac, Andres F. Gomez, Freddy Forero, Kaushik Roy:
Analysis of Bridge Defects in STT-MRAM Cells Under Process Variations and a Robust DFT Technique for Their Detection. VLSI-SoC (Selected Papers) 2018: 207-231 - 2017
- [c2]Freddy Forero, Jean-Marc Gallière, Michel Renovell, Víctor H. Champac:
Analysis of short defects in FinFET based logic cells. LATS 2017: 1-6 - 2016
- [j1]Freddy Forero, Andres F. Gomez, Víctor H. Champac:
Improvement of Negative Bias Temperature Instability Circuit Reliability and Power Consumption Using Dual Supply Voltage. J. Low Power Electron. 12(4): 395-402 (2016) - [c1]Freddy Forero, Andres F. Gomez, Víctor H. Champac:
A methodology for NBTI circuit reliability at reduced power consumption using dual supply voltage. LATS 2016: 81-86
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