- Sotirios P. Pouros, Vassilios D. Vassios, Dimitrios K. Papakostas, Alkis A. Hatzopoulos:
Input stimulus comparison using an adaptive FPGA-based testing system. ISCAS 2014: 277-280 - Vasileios Gerakis, Alkis A. Hatzopoulos
:
Substrate coupling noise considerations for frequencies up to 100GHz. MIXDES 2014: 351-355 - 2013
- Yiorgos I. Bontzios, Michael G. Dimopoulos, Alexandros I. Dimitriadis
, Alkis A. Hatzopoulos
:
Exact closed-form expressions for substrate resistance and capacitance extraction in nanoscale VLSI. Microelectron. J. 44(12): 1077-1083 (2013) - Nikolaos A. Tsatsoulis, Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos
:
Closed-form expressions for the coupling capacitance of metal fill tiles in VLSI circuits. Microelectron. J. 44(10): 953-958 (2013) - 2012
- Ilias Pappas, Stilianos Siskos, Alkis A. Hatzopoulos
:
A new analog output buffer for data driver of active matrix displays using low-temperature polycrystalline silicon thin-film transistors. DDECS 2012: 284-287 - 2011
- Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos
:
An evolutionary method for efficient computation of mutual capacitance for VLSI circuits based on the method of images. Simul. Model. Pract. Theory 19(2): 638-648 (2011) - Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos
:
A Nondestructive Method for Accurately Extracting Substrate Parameters of Arbitrary Doping Profile in Nanoscale VLSI. IEEE Trans. Instrum. Meas. 60(9): 3173-3184 (2011) - Alexios Spyronasios, Michael G. Dimopoulos, Alkis A. Hatzopoulos
:
Wavelet Analysis for the Detection of Parametric and Catastrophic Faults in Mixed-Signal Circuits. IEEE Trans. Instrum. Meas. 60(6): 2025-2038 (2011) - Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos
:
A memetic algorithm for computing 3D capacitance in multiconductor VLSI circuits. DDECS 2011: 341-346 - Rodoula Makri, Petros Tsenes, Dimitrios Economou, Yannis Papananos, Dimitrios Dervenis, Michael K. Birbas, John C. Kikidis, Vassilis Paliouras
, Grigorios Kalivas, Alexios N. Birbas, Panos Karaivazoglou, Yorgos Stratakos, John Korinthios, Stelios Siskos, Alkis A. Hatzopoulos, John Komninos, Serafeim Katsikas, Konstantinos N. Voudouris, Andreas Rigas, George Agapiou, Polivios Raxis:
Next generation millimeter wave backhaul radio: Overall system design for GbE 60GHz PtP wireless radio of high CMOS integration. ICECS 2011: 338-341 - Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos
:
Efficient inductance calculation for long and medium length rectangular interconnects in VLSI circuits. ISCAS 2011: 2337-2340 - Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos
:
Prospects of 3D inductors on through silicon vias processes for 3D ICs. VLSI-SoC 2011: 90-93 - 2010
- Dimitris K. Papakostas, Alkis A. Hatzopoulos
:
Improved analogue fault coverage estimation using probabilistic analysis. Int. J. Circuit Theory Appl. 38(5): 503-514 (2010) - Michael G. Dimopoulos, Alexios Spyronasios, Dimitris K. Papakostas, Dimitrios K. Konstantinou, Alkis A. Hatzopoulos
:
Circuit Implementation of a Supply Current Spectrum Test Method. IEEE Trans. Instrum. Meas. 59(10): 2660-2670 (2010) - Yiorgos I. Bontzios, Michael G. Dimopoulos, Alkis A. Hatzopoulos
:
A GA-based method for efficient interconnect capacitance computation in mixed-signal integrated circuits using sets of linear charges. ICECS 2010: 962-965 - Michael G. Dimopoulos, Alexios Spyronasios, Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos
:
Efficient testing of an optical feedback pixel driver using wavelet analysis. ICECS 2010: 1041-1044 - Michael G. Dimopoulos, Alexios Spyronasios, Alkis A. Hatzopoulos
:
Wavelet analysis of measurements for on-line testing analog & mixed-signal circuits. IOLTS 2010: 83-87 - Michael G. Dimopoulos, Dimitris K. Papakostas, Basilios D. Vassios, Alkis A. Hatzopoulos
:
Wavelet analysis of current measurements for mixed-signal circuit testing. ISCAS 2010: 1923-1926 - Alexios Spyronasios, Michael G. Dimopoulos, Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos
:
Testing Parametric and Catastrophic Faults in Mixed-Signal Integrated Circuits Using Wavelets. ISVLSI 2010: 232-237 - 2009
- Maria Drakaki
, Alkis A. Hatzopoulos
, Stylianos Siskos:
De-embedding method for on-wafer RF CMOS inductor measurements. Microelectron. J. 40(6): 958-965 (2009) - 2008
- Dimitris K. Papakostas, Alkis A. Hatzopoulos
:
A Unified Procedure for Fault Detection of Analog and Mixed-Mode Circuits Using Magnitude and Phase Components of the Power Supply Current Spectrum. IEEE Trans. Instrum. Meas. 57(11): 2589-2595 (2008) - Dimitrios K. Konstantinou, Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos
, Alexios Spyronasios:
Testing an Emergency Luminaire Circuit Using a Fault Dictionary Approach. DDECS 2008: 251-254 - Michael G. Dimopoulos, Dimitris K. Papakostas, Alexios Spyronasios, Alkis A. Hatzopoulos
, Dimitrios K. Konstantinou:
Power supply current testing in the production line of emergency luminaire circuits. ICECS 2008: 778-781 - 2007
- Michael G. Dimopoulos, Dimitris K. Papakostas, Alkis A. Hatzopoulos
, Evdokimos I. Konstantinidis
, Alexios Spyronasios:
Design and development of a versatile testing system for analog and mixed-signal circuits. ECCTD 2007: 846-849 - Maria Drakaki
, Alkis A. Hatzopoulos
, Stylianos Siskos:
Improving the quality factor estimation for differentially driven RF CMOS inductor. ECCTD 2007: 599-602 - Michael G. Dimopoulos, Dimitris K. Papakostas, Dimitrios K. Konstantinou, Alexios Spyronasios, Alkis A. Hatzopoulos
:
Multiple Parametric Circuit Analysis Tool for Detectability Estimation. ICECS 2007: 1111-1114 - Maria Drakaki
, Alkis A. Hatzopoulos, Stylianos Siskos:
CMOS Inductor Performance Estimation using Z- and S-parameters. ISCAS 2007: 2256-2259 - 2006
- Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos
, Dimitris K. Papakostas, C. A. Dimitriadis, Stilianos Siskos:
Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region. Microelectron. J. 37(11): 1313-1320 (2006) - Alkis A. Hatzopoulos, Stefanos Stefanou, Georges G. E. Gielen
, Dominique Schreurs
:
Assessment of parameter extraction methods for integrated inductor design and model validation. ISCAS 2006 - Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos, Dimitris K. Papakostas, C. A. Dimitriadis, Stilianos Siskos:
Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region. ISCAS 2006