1984 share record
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William B. Abbott IV : Time Specification Conformance of VLSI Test Systems O5. ITC 1984 : 105-112 share record
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Vishwani D. Agrawal : Will Testability Analysis Replace Fault Simulation ? ITC 1984 : 718-718 share record
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Dharma P. Agrawal , Sami A. Al-Arian : Comprehensive Fault Model and Testing of CMOS Circuits. ITC 1984 : 218-223 share record
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D. P. Ahrens , P. J. Bednarczyk , D. L. Denburg , R. M. Robertson : TPG2 : An Automatic Test Program Generator for Custom ICs. ITC 1984 : 762-767 share record
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Jeff Angwin , Paul Drake , Glenn Reader : The Need for Real-Time Intelligence When Testing VLSI. ITC 1984 : 752-761 share record
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Nobuo Arai , Yoshio Yamanaka : Parallel Testing of Random Logic LSIs. ITC 1984 : 827-833 share record
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Robert W. Atherton , Leonard Ekkelkamp , Chuck Schmitz : Logic Device Characterization Using Computer-Aided Test and Analysis. ITC 1984 : 367-383 share record
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Arthur Babitz , Kurt Lender : Using Simulation in the Design Process - A Case Study. ITC 1984 : 229-236 export record
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conf/itc/BalasubramaniamF84 share record
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Ramaswamy Balasubramaniam , Peretz Feder : Test Strategy for a 32-Bit Microprocessor Module with Memory Management. ITC 1984 : 598-605 share record
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Dean Bandes : Exploratory Data Analysis Makes Testing More Valuable for Semiconductor Manufacturing. ITC 1984 : 350-358 share record
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Paul H. Bardell , William H. McAnney : Parallel Pseudorandom Sequences for Built-In Test. ITC 1984 : 302-308 share record
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Catherine Bellon , Gabriele Saucier : CADOC : A System for Computer Aided Functional Test. ITC 1984 : 680-689 share record
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Catherine Bellon , Raoul Velazco : Hardware and Software Tools for Microprocessor Functional Test. ITC 1984 : 804-820 share record
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Bhargab B. Bhattacharya , Bidyut Gupta : Logical Modeling of Physical Failures and Their Inherent Syndrome Testability in MOS LSI/VLSI Networks. ITC 1984 : 847-855 share record
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Dilip K. Bhavsar , Balakrishnan Krishnamurthy : Can We Eliminate Fault Escape in Self-Testing by Polynomial Division (Signature Analysis) ? ITC 1984 : 134-139 share record
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Gene P. Bosse : High Speed Redundancy Processor. ITC 1984 : 282-286 share record
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Herb Boulton : Design Verification, Product Characterization and Production Testing of Hybrids and Printed Circuit Cards Using High-Sensitivity Thermography Systems. ITC 1984 : 747-751 export record
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conf/itc/Bozorgui-NesbatM84 share record
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Saied Bozorgui-Nesbat , Edward J. McCluskey : Lower Overhead Design for Testability of Programmable Logic Arrays. ITC 1984 : 856-865 share record
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Franc Brglez , Philip Pownall , Robert Hum : Applications of Testability Analysis: From ATPG to Critical Delay Path Tracing. ITC 1984 : 705-712 share record
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Robert S. Broughton , Michael G. Brashler : The Future is Now: Extending CAE into Test of Custom VLSI. ITC 1984 : 462-465 share record
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Steve Broyles : Automating Functional Programming for Micro-Based Boards. ITC 1984 : 730-736 share record
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Anthony J. Burke : Software Convergence of Test Program Parameters. ITC 1984 : 118-122 share record
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G. Siva Bushanam , Vance R. Harwood , Philip N. King , Roger D. Story : Measuring Thermal Rises Due to Digital Device Overdriving. ITC 1984 : 400-425 share record
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James F. Campbell Jr. : Transfer Function Estimation Part II : Some Experimental Results. ITC 1984 : 440-446 share record
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Michael J. Campbell : Monitored Burn-In (A Case Study for In-Situ Testing and Reliability Studies). ITC 1984 : 518-523 share record
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Stephen Caplow : Conquering Testability Problems by Combining In-Circuit and Functional Techniques. ITC 1984 : 581-588 share record
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J. Lawrence Carter : A Vote in Favor of Fault Simulation. ITC 1984 : 719-721 share record
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Harry H. Chen , Robert G. Mathews , John A. Newkirk : Test Generation for MOS Circuits. ITC 1984 : 70-79 share record
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Brian C. Crosby : Adapting CAE Design Information for In-Circuit Test Generation. ITC 1984 : 206-211 share record
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Ramaswami Dandapani , Janak H. Patel , Jacob A. Abraham : Design of Test Pattern Generators for Built-In Test. ITC 1984 : 315-319