"Techniques for improving the efficiency of sequential circuit test generation."

Xijiang Lin, Irith Pomeranz, Sudhakar M. Reddy (1999)

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DOI: 10.1109/ICCAD.1999.810639

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Xijiang Lin, Irith Pomeranz, Sudhakar M. Reddy:
Techniques for improving the efficiency of sequential circuit test generation. ICCAD 1999: 147-151

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