James F. Plusquellic

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Charles Lamech

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Publications

2016
[c49]
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Dylan Ismari, Jim Plusquellic, Charles Lamech, Swarup Bhunia, Fareena Saqib:
On detecting delay anomalies introduced by hardware trojans. ICCAD 2016: 44
2015
[j18]
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  - journals/tvlsi/SaqibILP15
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Fareena Saqib, Dylan Ismari, Charles Lamech, Jim Plusquellic:
Within-Die Delay Variation Measurement and Power Transient Analysis Using REBEL. IEEE Trans. Very Large Scale Integr. Syst. 23(4): 776-780 (2015)
2013
[c42]
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  - conf/dac/ChakrabortyLAP13
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Raj Chakraborty, Charles Lamech, Dhruva Acharyya, Jim Plusquellic:
A transmission gate physical unclonable function and on-chip voltage-to-digital conversion technique. DAC 2013: 59:1-59:10
[c41]
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J. Ju, Ray Chakraborty, Charles Lamech, Jim Plusquellic:
Stability analysis of a physical unclonable function based on metal resistance variations. HOST 2013: 143-150
2012
[c37]
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  - conf/host/LamechP12
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Charles Lamech, Jim Plusquellic:
Trojan detection based on delay variations measured using a high-precision, low-overhead embedded test structure. HOST 2012: 75-82
2011
[j13]
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  - journals/tifs/LamechRTP11
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Charles Lamech, Reza M. Rad, Mohammad Tehranipoor, Jim Plusquellic:
An Experimental Analysis of Power and Delay Signal-to-Noise Requirements for Detecting Trojans and Methods for Achieving the Required Detection Sensitivities. IEEE Trans. Inf. Forensics Secur. 6(3-2): 1170-1179 (2011)
[c35]
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Jim Aarestad, Charles Lamech, Jim Plusquellic, Dhruva Acharyya, Kanak Agarwal:
Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect. DAC 2011: 534-539
[c34]
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  - conf/iccad/LamechAPRA11
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Charles Lamech, Jim Aarestad, Jim Plusquellic, Reza M. Rad, Kanak Agarwal:
REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations. ICCAD 2011: 170-177

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