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Kun Qian 0014
Person information
- affiliation: University of California, Berkeley, CA, USA
Other persons with the same name
- Kun Qian — disambiguation page
- Kun Qian 0001 — Otto von Guericke University Magdeburg, Germany
- Kun Qian 0002 — IBM Almaden Research Center, USA (and 1 more)
- Kun Qian 0003 — Japan Society for the Promotion of Science, Tokyo, Japan (and 2 more)
- Kun Qian 0004 — University of Virginia, Department of Computer Science, Charlottesville, VA, USA (and 2 more)
- Kun Qian 0005 — Southeast University, Nanjing, China
- Kun Qian 0006 — Shandong University, School of Mathematics, Jinan, China
- Kun Qian 0007 — Beihang University, School of Computer Science and Engineering, State Key Laboratory of Software Development Environment, Beijing, China
- Kun Qian 0008 — Nanjing University of Finance and Economics, School of Accounting, China
- Kun Qian 0009 — King's College London, London, UK (and 1 more)
- Kun Qian 0010 — Xiamen University, Xiamen, Fujian Province, China
- Kun Qian 0011 — Anqing Normal University, Anqing, China
- Kun Qian 0012 — Hunan Institute of Science and Technology, College of Physics and Electronics, Yueyang, China
- Kun Qian 0013 — Kunming University of Science and Technology, Kunming, China
- Kun Qian 0015 — China Aerospace Science and Technology Corporation, Shanghai, China (and 1 more)
- Kun Qian 0016 — Columbia University, Dialogue NLP Lab, NY, USA
- Kun Qian 0017 — Tsinghua University, Department of Computer Science and Technology, Beijing, China (and 1 more)
- Kun Qian 0018 — University of Texas at Austin, Department of Civil, Architectural, and Environmental Engineering, Austin, TX, USA
- Kun Qian 0019 — University of Leeds, School of Electronic and Electrical Engineering, Leeds, UK
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Journal Articles
- 2011
- [j3]Lerong Cheng, Puneet Gupta, Costas J. Spanos, Kun Qian, Lei He:
Physically Justifiable Die-Level Modeling of Spatial Variation in View of Systematic Across Wafer Variability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(3): 388-401 (2011) - [j2]Borivoje Nikolic, Ji-Hoon Park, Jaehwa Kwak, Bastien Giraud, Zheng Guo, Liang-Teck Pang, Seng Oon Toh, Ruzica Jevtic, Kun Qian, Costas J. Spanos:
Technology Variability From a Design Perspective. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(9): 1996-2009 (2011) - 2009
- [j1]Liang-Teck Pang, Kun Qian, Costas J. Spanos, Borivoje Nikolic:
Measurement and Analysis of Variability in 45 nm Strained-Si CMOS Technology. IEEE J. Solid State Circuits 44(8): 2233-2243 (2009)
Conference and Workshop Papers
- 2009
- [c1]Lerong Cheng, Puneet Gupta, Costas J. Spanos, Kun Qian, Lei He:
Physically justifiable die-level modeling of spatial variation in view of systematic across wafer variability. DAC 2009: 104-109
Coauthor Index
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