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ORCIDLeonardo Bonet Zordan
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Journal Articles
- 2014
[j1]Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel
, Nabil Badereddine:
On the Test and Mitigation of Malfunctions in Low-Power SRAMs. J. Electron. Test. 30(5): 611-627 (2014)
Conference and Workshop Papers
- 2016
- [c12]Josef Kinseher, Leonardo Bonet Zordan, Ilia Polian, Andreas Leininger:
Improving SRAM test quality by leveraging self-timed circuits. DATE 2016: 984-989 - [c11]Josef Kinseher, Moritz Völker, Leonardo Bonet Zordan, Ilia Polian:
Failure mechanisms and test methods for the SRAM TVC write-assist technique. ETS 2016: 1-2 - [c10]Khalid Latif, Manuel Selva, Charles Effiong, Roman Ursu, Abdoulaye Gamatié, Gilles Sassatelli, Leonardo Bonet Zordan, Luciano Ost, Piotr Dziurzanski, Leandro Soares Indrusiak:
Design space exploration for complex automotive applications: an engine control system case study. RAPIDO@HiPEAC 2016: 2:1-2:7 - [c9]Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Leonardo Bonet Zordan:
An effective BIST architecture for power-gating mechanisms in low-power SRAMs. ISQED 2016: 185-191 - 2015
- [c8]Josef Kinseher, Leonardo Bonet Zordan, Ilia Polian:
On the Use of Assist Circuits for Improved Coupling Fault Detection in SRAMs. ATS 2015: 61-66 - 2013
- [c7]Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
Test solution for data retention faults in low-power SRAMs. DATE 2013: 442-447 - [c6]Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs. ITC 2013: 1-10 - [c5]Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
A built-in scheme for testing and repairing voltage regulators of low-power srams. VTS 2013: 1-6 - 2012
- [c4]Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
Defect analysis in power mode control logic of low-power SRAMs. ETS 2012: 1 - [c3]Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
Low-power SRAMs power mode control logic: Failure analysis and test solutions. ITC 2012: 1-10 - 2011
- [c2]Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Nabil Badereddine:
Failure Analysis and Test Solutions for Low-Power SRAMs. Asian Test Symposium 2011: 459-460 - [c1]Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine:
Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling. DDECS 2011: 353-358
Coauthor Index
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