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"On the reuse of read and write assist circuits to improve test efficiency ..."
Leonardo Bonet Zordan et al. (2013)
- Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs. ITC 2013: 1-10
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