"Improving SRAM test quality by leveraging self-timed circuits."

Josef Kinseher et al. (2016)

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DOI: —

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-09

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Josef Kinseher, Leonardo Bonet Zordan, Ilia Polian, Andreas Leininger:
Improving SRAM test quality by leveraging self-timed circuits. DATE 2016: 984-989

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