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Journal Articles
- 2024
[j8]René Laflamme, Piotr Putek, Tomasz Piasecki, Teodor P. Gotszalk:
Digital Analysis of Damped Vibrations. IEEE Instrum. Meas. Mag. 27(5): 52-61 (2024)- [j7]Andrzej Sikora
, Krzysztof Gajewski, Dominik Badura, Bartosz Pruchnik, Tomasz Piasecki, Kamil Raczkowski, Teodor P. Gotszalk:
Conductive Atomic Force Microscopy - Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties. Sensors 24(17): 5649 (2024) - 2019
- [j6]Piotr Kunicki, Tihomir Angelov, Tzvetan Ivanov, Teodor P. Gotszalk, Ivo Rangelow:
Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam Processing. Sensors 19(20): 4429 (2019) - 2018
- [j5]Paolo Di Barba, Teodor P. Gotszalk, Wojciech Majstrzyk, Maria Evelina Mognaschi, Karolina Orlowska, Slawomir Wiak, Andrzej Sierakowski:
Optimal Design of Electromagnetically Actuated MEMS Cantilevers. Sensors 18(8): 2533 (2018) - 2015
- [j4]Stefan Goniszewski, John C. Gallop, Mohammad Adabi, Krzysztof Gajewski, Olena Shaforost, Norbert Klein, Andrzej Sierakowski, Jie Chen, Yifang Chen, Teodor P. Gotszalk, Ling Hao:
Self-supporting graphene films and their applications. IET Circuits Devices Syst. 9(6): 420-427 (2015) - 2011
- [j3]Artur Wiatrowski, W. M. Posadowski, Grzegorz Józwiak, Jaroslaw Serafinczuk, R. F. Szeloch, Teodor P. Gotszalk:
Standard and self-sustained magnetron sputtering deposited Cu films investigated by means of AFM and XRD. Microelectron. Reliab. 51(7): 1203-1206 (2011) - 2009
- [j2]Mauro Giacomini, Laura Pastorino, Federico Caneva Soumetz, J. A. Mielczarski, E. Mielczarski, Ivo Rangelow, Teodor P. Gotszalk:
Data Modeling for Tools and Technologies for the Analysis and Synthesis of NANOstructures (TASNANO) Project. J. Inf. Technol. Res. 2(3): 49-70 (2009) - 2002
- [j1]R. F. Szeloch, Teodor P. Gotszalk, Pawel Janus:
Scanning Thermal Microscopy in Microsystem Reliability Analysis. Microelectron. Reliab. 42(9-11): 1719-1722 (2002)
Conference and Workshop Papers
- 2016
- [c1]Francesco Ivaldi, Tomasz Bieniek, Pawel Janus, Jerzy Zajac, Piotr Grabiec, Wojciech Majstrzyk, D. Kopiec, Teodor P. Gotszalk:
New approach for a multi-cantilever arrays sensor system with advanced MOEMS readout. ESSDERC 2016: 444-447
Informal and Other Publications
- 2011
- [i1]Grzegorz Józwiak, A. Henrykowski, A. Masalska, Teodor P. Gotszalk, I. Ritz, H. Steigmann:
The regularized blind tip reconstruction algorithm as a scanning probe microscopy tip metrology method. CoRR abs/1105.1472 (2011)
Coauthor Index
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