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G. Lekens

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Journal Articles

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2007
[j3]
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  dblp key:
  - journals/mr/MoonenVLCMB07
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  - https://dblp.org/rec/journals/mr/MoonenVLCMB07
R. Moonen, Piet Vanmeerbeek, G. Lekens, Ward De Ceuninck, Peter Moens, J. Boutsen:
Lifetime modeling of intrinsic gate oxide breakdown at high temperature. Microelectron. Reliab. 47(9-11): 1389-1393 (2007)
2005
[j2]
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  - journals/mr/PostLBHSSWOLD05
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H. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Yves Ousten, G. Lekens, A. Dehbi:
Failure mechanisms and qualification testing of passive components. Microelectron. Reliab. 45(9-11): 1626-1632 (2005)
2003
[j1]
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  - journals/mr/SoussanLDCB03
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Philippe Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, Eric Beyne:
Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. Microelectron. Reliab. 43(9-11): 1785-1790 (2003)

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