BibTeX record journals/mr/PostLBHSSWOLD05

download as .bib file

@article{DBLP:journals/mr/PostLBHSSWOLD05,
  author    = {H. A. Post and
               P. Letullier and
               T. Briolat and
               R. Humke and
               R. Schuhmann and
               K. Saarinen and
               W. Werner and
               Yves Ousten and
               G. Lekens and
               A. Dehbi},
  title     = {Failure mechanisms and qualification testing of passive components},
  journal   = {Microelectron. Reliab.},
  volume    = {45},
  number    = {9-11},
  pages     = {1626--1632},
  year      = {2005},
  url       = {https://doi.org/10.1016/j.microrel.2005.07.085},
  doi       = {10.1016/j.microrel.2005.07.085},
  timestamp = {Sat, 22 Feb 2020 19:28:58 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/PostLBHSSWOLD05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics