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Books and Theses
- 2015
[b1]Michael E. Imhof:
Fault tolerance infrastructure and its reuse for offline testing: synergies of a unified architecture to cope with soft errors and hard faults. University of Stuttgart, 2015
Journal Articles
- 2015
- [j3]Stefan Holst, Michael E. Imhof, Hans-Joachim Wunderlich:
High-Throughput Logic Timing Simulation on GPGPUs. ACM Trans. Design Autom. Electr. Syst. 20(3): 37:1-37:22 (2015) - 2013
- [j2]Lars Bauer, Claus Braun, Michael E. Imhof, Michael A. Kochte, Eric Schneider, Hongyan Zhang, Jörg Henkel, Hans-Joachim Wunderlich:
Test Strategies for Reliable Runtime Reconfigurable Architectures. IEEE Trans. Computers 62(8): 1494-1507 (2013) - 2011
- [j1]Rafal Baranowski, Stefano Di Carlo
, Nadereh Hatami, Michael E. Imhof, Michael A. Kochte, Paolo Prinetto, Hans-Joachim Wunderlich, Christian G. Zoellin:
Efficient multi-level fault simulation of HW/SW systems for structural faults. Sci. China Inf. Sci. 54(9): 1784-1796 (2011)
Conference and Workshop Papers
- 2014
- [c22]Atefe Dalirsani, Nadereh Hatami, Michael E. Imhof, Marcus Eggenberger, Gert Schley, Martin Radetzki, Hans-Joachim Wunderlich:
On Covering Structural Defects in NoCs by Functional Tests. ATS 2014: 87-92 - [c21]Hongyan Zhang, Michael A. Kochte, Michael E. Imhof, Lars Bauer, Hans-Joachim Wunderlich, Jörg Henkel:
GUARD: GUAranteed Reliability in Dynamically Reconfigurable Systems. DAC 2014: 32:1-32:6 - [c20]Michael E. Imhof, Hans-Joachim Wunderlich:
Bit-Flipping Scan - A unified architecture for fault tolerance and offline test. DATE 2014: 1-6 - [c19]Matthias Sauer, Ilia Polian, Michael E. Imhof, Abdullah Mumtaz, Eric Schneider, Alexander Czutro, Hans-Joachim Wunderlich, Bernd Becker:
Variation-aware deterministic ATPG. ETS 2014: 1-6 - [c18]Atefe Dalirsani, Michael E. Imhof, Hans-Joachim Wunderlich:
Structural Software-Based Self-Test of Network-on-Chip. VTS 2014: 1-6 - 2013
- [c17]Rafal Baranowski, Alejandro Cook, Michael E. Imhof, Chang Liu, Hans-Joachim Wunderlich:
Synthesis of workload monitors for on-line stress prediction. DFTS 2013: 137-142 - [c16]Hongyan Zhang, Lars Bauer, Michael A. Kochte, Eric Schneider, Claus Braun, Michael E. Imhof, Hans-Joachim Wunderlich, Jörg Henkel:
Module diversification: Fault tolerance and aging mitigation for runtime reconfigurable architectures. ITC 2013: 1-10 - 2012
- [c15]Lars Bauer, Claus Braun, Michael E. Imhof, Michael A. Kochte, Hongyan Zhang, Hans-Joachim Wunderlich, Jörg Henkel:
OTERA: Online test strategies for reliable reconfigurable architectures - Invited paper for the AHS-2012 special session "Dependability by reconfigurable hardware". AHS 2012: 38-45 - [c14]Alexander Czutro, Michael E. Imhof, J. Jiang, Abdullah Mumtaz, Matthias Sauer, Bernd Becker, Ilia Polian, Hans-Joachim Wunderlich:
Variation-Aware Fault Grading. Asian Test Symposium 2012: 344-349 - [c13]Mohamed Abdelfattah, Lars Bauer, Claus Braun, Michael E. Imhof, Michael A. Kochte, Hongyan Zhang, Jörg Henkel, Hans-Joachim Wunderlich:
Transparent structural online test for reconfigurable systems. IOLTS 2012: 37-42 - [c12]Alejandro Cook, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, Hans-Joachim Wunderlich:
Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test. LATW 2012: 1-4 - [c11]D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Michael E. Imhof, Hans-Joachim Wunderlich:
A pseudo-dynamic comparator for error detection in fault tolerant architectures. VTS 2012: 50-55 - 2011
- [c10]Abdullah Mumtaz, Michael E. Imhof, Stefan Holst, Hans-Joachim Wunderlich:
Embedded Test for Highly Accurate Defect Localization. Asian Test Symposium 2011: 213-218 - [c9]Michael E. Imhof, Hans-Joachim Wunderlich:
Soft error correction in embedded storage elements. IOLTS 2011: 169-174 - [c8]Abdullah Mumtaz, Michael E. Imhof, Hans-Joachim Wunderlich:
P-PET: Partial pseudo-exhaustive test for high defect coverage. ITC 2011: 1-8 - 2010
- [c7]Michael A. Kochte, Christian G. Zoellin, Rafal Baranowski, Michael E. Imhof, Hans-Joachim Wunderlich, Nadereh Hatami, Stefano Di Carlo, Paolo Prinetto:
Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level. Asian Test Symposium 2010: 3-8 - [c6]Michael A. Kochte, Christian G. Zoellin, Rafal Baranowski, Michael E. Imhof, Hans-Joachim Wunderlich, Nadereh Hatami, Stefano Di Carlo, Paolo Prinetto:
System reliability evaluation using concurrent multi-level simulation of structural faults. ITC 2010: 817 - 2009
- [c5]Michael A. Kochte, Christian G. Zoellin, Michael E. Imhof, Rauf Salimi Khaligh, Martin Radetzki, Hans-Joachim Wunderlich, Stefano Di Carlo, Paolo Prinetto:
Test exploration and validation using transaction level models. DATE 2009: 1250-1253 - 2008
- [c4]Melanie Elm, Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, Jens Leenstra, Nicolas Mäding:
Scan chain clustering for test power reduction. DAC 2008: 828-833 - [c3]Michael A. Kochte, Christian G. Zoellin, Michael E. Imhof, Hans-Joachim Wunderlich:
Test Set Stripping Limiting the Maximum Number of Specified Bits. DELTA 2008: 581-586 - [c2]Michael E. Imhof, Hans-Joachim Wunderlich, Christian G. Zoellin:
Integrating Scan Design and Soft Error Correction in Low-Power Applications. IOLTS 2008: 59-64 - 2007
- [c1]Michael E. Imhof, Christian G. Zoellin, Hans-Joachim Wunderlich, Nicolas Mäding, Jens Leenstra:
Scan Test Planning for Power Reduction. DAC 2007: 521-526
Coauthor Index
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